Manuel BARRAGAN

Professional position

Education

Habilitation à diriger des recherches

European Ph.D. in Microelectronics

Licenciado en Física (5-year degree in Physics), graduated with honors, ranked first in class

Research milestones and activity highlights in the last 5 years

Scientific highlights

• First-ever non-intrusive mm-wave test: we have outlined and demonstrated the first-ever machine learning-based non-intrusive test methodology for mm-Wave circuits. This work was awarded a Best Paper Award from the IEEE European Test Symposium 2018 and a Best Poster Award from the Journées Nationales de Réseau Doctoral en Micro-nanoélectronique 2017.
• Advanced modeling of mm-wave couplers for design enhancement: first-ever design-oriented model considering frequency-dependent electrical losses. This work was the Best Reading Paper in the Decem- ber 2020 issue of IEEE Trans. on Microwave Theory and Techniques.
• First-ever OBT technique for mm-wave circuits: we have demonstrated the potential of Oscillation- Based Test techniques for the test and calibration of phased arrays. This work was selected as a Best Paper candidate in IEEE VLSI Test Symposium 2018.
• First-ever exploration of causal features for AMS-RF indirect test:  in collaboration with the Institute of Microelectronics of Seville (IMSE-CNM), we have proposed novel causal feature selection techniques for diagnosis enhanced machine learning-based test of AMS-RF circuits. This work was selected as a Best Paper candidate in Design Automation and Test in Europe 2017. 

Communication and editorial activities

• Review Editor for Wiley’s International Journal of Circuit Theory and Applications. Guest Editor for international journals, including the Journal of Electronic Testing and the IEEE Transactions on Circuits and Systems-I: Regular Papers.
• Technical Program Chair for the IEEE Interregional NEWCAS conference (2020 and 2021 editions).
• Topic Chair in Design Automation and Test in Europe for topic Design and Test for Analog and Mixed-Signal Circuits and Systems (2020 and 2021 editions).
• Program committee member for the main international events in my area of research: IEEE European Test Symposium, IEEE VLSI Test Symposium, IEEE Asian Test Symposium, Design Automation and Test in Europe, IEEE International Mixed-Signal Testing Workshop, IEEE International Symposium on Circuits and Systems, IFIP/IEEE International Conference on Very Large Scale Integration, etc.

Collaborations

• PYXCAD Common Laboratory with the company XDIGIT, focused on design of advanced Analog-to-Digital converters for imaging applications.
• Industrial collaborations with ST Microelectronics (3 CIFRE PhDs, TARANTO and HADES European projects, Nano2017 and Nano2022 programs) and NXP (1 CIFRE PhD to start in 2021).
• Industrial collaboration with NXP (1 CIFRE PhD).
• Academic collaborations with RFIC-Lab, Grenoble, France, IMSE-CNM, Seville, Spain and the Indian Institute of Technology Johdpur, India.

Publications