Lucio Neri BORGES

The aim of this thesis project is to propose an Oscillation Based Test (OBT) technique for integrated self-test (BIST), enabling effective reconfiguration of a millimeter phase shifter throughout its lifetime, from the production line to its use in the field.

Enabling effective reconfiguration throughout the lifetime of a millimeter-scale component, implies: a) being able to assess the circuit's performance at a given point in time; and b) being able to act on the circuit's configuration to compensate for any observed performance degradation.

Evaluating a circuit's performance and adjusting it during operation requires Built-In Self-Test (BIST) capabilities, i.e. the integration of on-board test instruments with the Device Under Test (DUT). However, integrating the test instruments required for full functional characterization of a millimeter-band phase shifter is not a feasible solution. It is therefore of major interest to develop low-cost test techniques for millimeter-band phase shifters.

In contrast to the complexity of traditional BIST approaches, in this project we propose a simple OBT technique to enable self-testing and self-calibration applications for integrated millimeter-wave phase shifters in phased array antennas.