Nasr-Eddine OULDEI TEBINA

Abstract: In digital applications, electronic components must guarantee the security of the processed information. Physical attacks are now well-known threats, and the research for new attack techniques remains a very active field: the use of X-ray illumination has been recently proved feasible to alter the content of memory cells. In this context, the MITIX project aims at proving that X-Rays can effectively constitute a serious threat for secure implementations, even when more affordable equipment is used.
During this thesis, the candidate is expected to analyze the sensitivity of secure circuits thanks to simulation models and compare them with experimental results in order to possibly predict the experimental outcomes and extract sensitivity maps extended to a larger area of the topology. The candidate will then be able to use the developed models and flow in order to evaluate hardening techniques or fault attack countermeasures.