Publications

Publications

Recherche

Recherche

Auteur
hors TIMA
Équipe :

Mot clé
Type de publications
Tous
Sélectionne/déselectionne tous les types de publications
Journal art.
International National Tous
 Brevets  Conférences invitées
Conference art.
International National Tous
Chapitres de livre  Livres & Éditions Ouvrages
 Autres communications
 Logiciels  Thèses
 
 année
 

12 résultats

  5 Revues internationales
  5 Conférences internationales
  2 Conférences nationales

5 Revues internationales

1 Garay Trindade M., Benevenuti F., Letiche M., Beaucour J., Kastensmidt F., Possamai Bastos R., Effects of thermal neutron radiation on a hardware-implemented machine learning algorithm, Microelectronics Reliability, Ed. Elsevier, Vol. 116, No. 114022, DOI: 10.1016/j.microrel.2020.114022, janvier 2021
 
2 Possamai Bastos R., Dutertre J.M., Garay Trindade M., Andreoni Camponogara Viera R., Potin O., Letiche M., Cheymol B., Beaucour J., Assessment of On-Chip Current Sensor for Detection of Thermal-Neutron Induced Transients, IEEE Transactions on Nuclear Science, Ed. IEEE, Vol. 67, No. 7, pp. 1404-1411, DOI: 10.1109/tns.2020.2975923, 2020
 
3 Aquino Guazzelli R., Garay Trindade M., Acunha Guimaraes L., Ferreira De Paiva Leite T., Fesquet L., Possamai Bastos R., Trojan Detection Test for Clockless Circuits, Journal of Electronic Testing: Theory and Applications, Ed. Springer , Vol. , février 2020
 
4 Aquino Guazzelli R., Garay Trindade M., Fesquet L., Possamai Bastos R., Learning-Based Reliability Assessment Method for Detection of Permanent Faults in Clockless Circuits, Microelectronics Reliability, Ed. Elsevier, Vol. , septembre 2019
 
5 Garay Trindade M., Coelho A., Valadares C., Andreoni Camponogara Viera R., Rey S., Cheymol B., Baylac M., Velazco R., Possamai Bastos R., Assessment of a Hardware-Implemented Machine Learning Technique under Neutron Irradiation, IEEE Transactions on Nuclear Science, Ed. IEEE, Vol. , juin 2019
 
remonter

5 Conférences internationales

1 Garay Trindade M., Garibotti R.F., Ost L., Letiche M., Beaucour J., Possamai Bastos R., Assessment of Machine Learning Algorithms for Near-Sensor Computing Under Radiation Soft Errors, 16th International School on the Effects of Radiation on Embedded Systems for Space Applications (SERESSA 2020), Porto Alegre (Virtual edition), BRAZIL, 1 au 4 décembre 2020
 
2 Garay Trindade M., Garibotti R.F., Ost L., Letiche M., Beaucour J., Possamai Bastos R., Assessment of Machine Learning Algorithms for Near-Sensor Computing Under Radiation Soft Errors, IEEE International conference on electronics, circuits & systems (ICECS 2020), Glasgow, SCOTLAND, UNITED KINGDOM, 23 au 25 novembre 2020
 
3 Possamai Bastos R., Dutertre J.M., Garay Trindade M., Andreoni Camponogara Viera R., Potin O., Rey S., Cheymol B., Baylac M., Assessment of Current Sensor on Chip for Detecting Neutron-Induced Transients via Body Terminals, Conference on Radiation Effects on Components and Systems (RADECS 2019), Montpellier, FRANCE, 16 au 20 septembre 2019
 
4 Aquino Guazzelli R., Garay Trindade M., Fesquet L., Possamai Bastos R., Learning-Based Reliability Assessment Method for Detection of Permanent Faults in Clockless Circuits, 30th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2019), Toulouse, FRANCE, 23 au 26 août 2019
 
5 Garay Trindade M., Coelho A., Valadares C., Andreoni Camponogara Viera R., Rey S., Cheymol B., Baylac M., Velazco R., Possamai Bastos R., Assessment of Hardware-Implemented Support Vector Machine under Radiation Effects, Conference on Radiation Effects on Components and Systems (RADECS'2018), Gothenburg, SWEDEN, 16 au 21 septembre 2018
 
remonter

2 Conférences nationales

1 Aquino Guazzelli R., Garay Trindade M., Fesquet L., Possamai Bastos R., Exploring a Non-conventional Testing Technique for Asynchronous Circuits, 21èmes Journées Nationales du Réseau Doctoral en Microélectronique (JNRDM 2019), Montpellier, FRANCE, 3 au 5 juin 2019
 
2 Garay Trindade M., Possamai Bastos R., On the reliability of Support Vector Machines, 21èmes Journées Nationales du Réseau Doctoral en Microélectronique (JNRDM 2019), Montpellier, FRANCE, 3 au 5 juin 2019
 
remonter