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129 résultats

  18 Revues internationales
   1 Brevets
   6 Conférences invitées
  69 Conférences internationales
   3 Chapitres de livre
   4 Livres & Éditions Ouvrages
   8 Conférences nationales
   5 Autres communications
  14 Rapports
   1 Thèses

18 Revues internationales

 1 Chegari B., Tabaa M., Moutaouakkil F., Simeu E., Medromi H., Local energy self-sufficiency for passive buildings: Case study of a typical Moroccan building, Journal of Building Engineering, Ed. Elsevier, Vol. 29, No. 101164, DOI: 10.1016/j.jobe.2019.101164, mai 2020
 
 2 Tchuani Tchakonte D., Simeu E., Thuente M., Lifetime optimization of wireless sensor networks with sleep mode energy consumption of sensor nodes, Wireless Networks, Ed. Springer , Vol. , pp. 1-10, DOI: 10.1007/s11276-018-1783-3, juillet 2018
 
 3 Youssoufa M., Foutse M., Lealea T., Njike Kouekeu L. C., Tueche F., Simeu E., Accuracy enhancement in low frequency gain and phase detector (AD8302) based bioimpedance spectroscopy system, Measurement, Vol. 123, pp. 304-308, mars 2018
 
 4 Nzebop Ndenoka G., Simeu E., Alhakim R., Efficient controller synthesis of multi-energy systems for autonomous domestic water supply, Revue Africaine de la Recherche en Informatique et Mathématiques Appliquées (INRIA), Vol. 24, pp. 65-88, DOI: hal-01309417, 2017
 
 5 Takam Tchendjou G., Simeu E., Alhakim R., Fuzzy Logic Based Objective Image Quality Assessment with FPGA Implementation, Journal of Systems Architecture (JSA), Ed. Elsevier, Vol. 82, pp. 24-36, DOI: 10.1016/j.sysarc.2017.12.002, décembre 2017
 
 6 Andraud M., Stratigopoulos H., Simeu E., One-Shot Non-Intrusive Calibration Against Process Variations for Analog/RF circuits, IEEE Transactions on Circuits and Systems, Ed. IEEE, Vol. 63, No. 11, DOI: 10.1109/TCSI.2016.2598184 , novembre 2016
 
 7 Alhakim R., Raoof K., Simeu E., Design of tracking loop with dirty templates for UWB communication systems, Signal Image and Video Processing Journal, Ed. Springer , Vol. 8, No. 3, pp. 461-477, DOI: 10.1007/s11760-012-0352-y, mars 2014
 
 8 Alhakim R., Raoof K., Simeu E., Detection of UWB signal using dirty template approach, Signal Image and Video Processing Journal, Ed. Springer , Vol. 8, No. 3, pp. 549-563, DOI: 10.1007/s11760-013-0554-y, mars 2014
 
 9 Alhakim R., Simeu E., Raoof K., Novel control for delay-locked loop in IR-UWB communication systems, Control Engineering Practice, Ed. IFAC - International Federation of Automatic Control, Vol. 21, No. 10, pp. 1437-1454, DOI: 10.1016/j.conengprac.2013.06.014, octobre 2013
 
10 Alhakim R., Raoof K., Simeu E., Serrestou Y., Cramer-Rao lower bounds and maximum likelihood timing synchronization for dirty template UWB communications , Signal Image and Video Processing Journal, Ed. Springer , Vol. 7, July, No. 4, pp. 741-757, DOI: 10.1007/s11760-011-0265-1, juillet 2013
 
11 Kamsu-Foguem B., Simeu E., Optimizing Construction of Scheduled Data Flow Graph for Online testability, The Mediterranean Journal of Computers and Networks , Vol. 8, No. 4, pp. 125-133, janvier 2012
 
12 Bousquet L., Cenni F., Simeu E., Inclusion of Power Consumption Information in High-Level Modeling of Linear Analog Blocks , Journal of Low Power Electronics (JOLPE), Ed. American Scientific Publishers, Vol. 7, No. 4, pp. 541-551, DOI: http://dx.doi.org/10.1166/jolpe.2011.1156, janvier 2011
 
13 Dhayni A., Mir S., Rufer L., Bounceur A., Simeu E., Pseudorandom BIST for test and characterization of linear and nonlinear MEMS, Microelectronics journal, Ed. Elsevier, Vol. 40, No. 7, pp. 1054-1061, DOI: 10.1016/j.mejo.2008.05.012, juillet 2009
 
14 Simeu E., Nguyen H.N., Cauvet P., Mir S., Rufer L., Khereddine R., Using signal envelope detection for online and offline RF MEMS switch testing, Journal of VLSI Design, Ed. Hindawi Publishing Corporation, Vol. 2008, No. Article ID 294014, pp. 1-10, DOI: 10.1155/2008/294014, janvier 2008
 
15 Bounceur A., Mir S., Simeu E., Rolindez L., Estimation of test metrics for the optimisation of analogue circuit testing, Journal of Electronic Testing: Theory and Applications, Ed. Springer , Vol. 23, No. 6, pp. 471-484, DOI: 10.1007/s10836-007-5006-6, juin 2007
 
16 Rufer L., Mir S., Simeu E., Domingues C., On-chip pseudorandom MEMS testing, Journal of Electronic Testing: Theory and Applications, Ed. Springer , Vol. 21, No. 3, pp. 233-241, DOI: 10.1007/s10836-005-6353-9, juin 2005
 
17 Simeu E., Optimal detector design for on-line testing of linear analog systems, Journal of VLSI Design, Ed. Hindawi Publishing Corporation, Vol. 11, No. 1, pp. 59-74, janvier 2000
 
18 Simeu E., Georges D., Modeling and control of an eddy current brake, Control Engineering Practice, Ed. IFAC - International Federation of Automatic Control, Vol. 4, No. 1, pp. 19-26, janvier 1996
 
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1 Brevets

1 Lefebvre A., Feuillebois C., Simeu E., Bortolin-Argenton E., Procédé de détection de défaillance d'un capteur analogique et dispositif de détection pour mettre en œuvre le dit procédé, No. 08/03.420, 19 juin 2008
 
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6 Conférences invitées

1 Dimakos A., Andraud M., Abdallah L., Stratigopoulos H., Simeu E., Mir S., Test and calibration of RF circuits using built-in non-intrusive sensors, Invited talk (Special Session), IEEE International Computer Society Annual Symposium on VLSI (ISVLSI'15), pp. 627, Montpellier, FRANCE, DOI: 10.1109/ISVLSI.2015.42, 8 au 10 juillet 2015
 
2 Simeu E., Embedded Test and Control of Analogue/RF Circuits Using Intelligent Resources, Embedded tutorial, 11th Latin America Test Workshop (LATW'10), Punta del Este, URUGUAY, 28 au 31 mars 2010
 
3 Mir S., Rufer L., Simeu E., Nguyen H.N., Khereddine R., DFT for MEMS, Invited Talk, RF-MEMS Workshop on Industry Applications: RF power MEMS: reliability and applications, Barcelona, SPAIN, 28 juin 2007
 
4 Simeu E., Mir S., Rufer L., Concurrent testing embedded systems: adapting automatic control techniques to microelectronics testing , Invited Talk, 16th IFAC World Congress, pp. Paper Tu-A15-TO, Prague, CZECH REPUBLIC, 4 au 8 juillet 2005
 
5 Simeu E., Mir S., Rufer L., Online testing embedded systems: adapting automatic control techniques to microelectronics testing, Invited Talk, 16th IFAC World Congress, pp. 1180-1180, Prague, CZECH REPUBLIC, DOI: 10.3182/20050703-6-CZ-1902.01181, 1 juillet 2005
 
6 Mir S., Prenat G., Rolindez L., Simeu E., Rufer L., On-chip analogue testing based on ΣΔ modulation, Invited Talk, Workshop on the testing of high resolution mixed signal interfaces, Ajaccio, Corse, FRANCE, 1 mai 2004
 
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69 Conférences internationales

 1 Portolan M., Silveira Feitoza R., Takam Tchendjou G., Reynaud V., Senthamarai Kannan K., Barragan M., Simeu E., Maistri P., Anghel L., Leveugle R., Mir S., A Comprehensive End-to-end Solution for a Secure and Dynamic Mixed-signal 1687 System, 2020 International Symposium on On-Line Testing and Robust System Design (IOLTS 2020), Naples (Napoli), ITALY, DOI: 10.1109/IOLTS50870.2020.9159721, 13 juillet au 21 septembre 2020
 
 2 Nzebop Ndenoka G., Tchuente M., Simeu E., Langage et sémantique des expressions pour la synthèse de modèle Grafcet dans un environnement IDM, Conférence de Recherche en Informatique (CRI 2019), Yaoundé, CAMEROON, 3 au 4 décembre 2019
 
 3 Tchuani Tchakonte D., Simeu E., Tchuente M., Optimization of wireless sensor network lifetime for target coverage applications, Conférence de Recherche en Informatique 2019 (CRI 2019), Yaoundé, CAMEROON, 3 au 4 décembre 2019
 
 4 Chegari B., Tabaa M., Moutaouakkil F., Simeu E., Medromi H., Energy savings and thermal comfort benefits of shading devices: case study of a typical moroccan building, 4th International Conference on Smart City Applications (ACM 2019), pp. 63, Casablanca, MOROCCO, 2 au 4 octobre 2019
 
 5 Chegari B., Tabaa M., Moutaouakkil F., Simeu E., Medromi H., The impact of the thermos-physical parameters of insulation on the energy performance of a building in Morocco, International Conference of Computer Science and Renewable Energies (ICCSRE 2019), pp. 1-6, Agadir, MOROCCO, DOI: 10.1109/ICCSRE.2019.8807480, 23 au 24 juillet 2019
 
 6 Takam Tchendjou G., Simeu E., Self-Healing Image Sensor Using Defective Pixel Correction Loop, International Conference on Control, Automation and Diagnosis (ICCAD 2019), Grenoble, FRANCE, DOI: 10.1109/ICCAD46983.2019.9037971, 2 au 4 juillet 2019
 
 7 Takam Tchendjou G., Simeu E., Control Loop of Image Correction based on Detection and Self-Healing of Defective Pixels, 25th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2019), Rhodes Island, GREECE, DOI: 10.1109/IOLTS.2019.8854390, 1 au 3 juillet 2019
 
 8 Takam Tchendjou G., Simeu E., Defective pixel analysis for Image sensor online diagnostic and self-healing, 37th IEEE VLSI Test Symposium (VTS 2019), Monterey, UNITED STATES, DOI: 10.1109/VTS.2019.8758638, 23 au 25 avril 2019
 
 9 Takam Tchendjou G., Simeu E., Self-Healing Imager Based on Detection and Conciliation of Defective Pixels, IEEE International Symposium on On-Line Testing And Robust System Design (IOLTS'2018), pp. 251-254, Platja d’Aro, Costa Brava, SPAIN, DOI: 10.1109/IOLTS.2018.8474149, 2 au 4 juillet 2018
 
10 Takam Tchendjou G., Simeu E., Lebowsky F., FPGA Implementation of Machine Learning Based Image Quality Assessment, 27th International Conference on Microelectronics (ICM 2017), pp. 1-4, Beirut, LEBANON, DOI: 10.1109/ICM.2017.8268848, 10 au 13 décembre 2017
 
11 Takam Tchendjou G., Alhakim R., Simeu E., Fuzzy logic modeling for objective image quality assessment, Conference on Design and Architecture for Signal and Image Processing (DASIP 2016), pp. 98-105, Rennes, FRANCE, DOI: 10.1109/DASIP.2016.7853803, 12 au 14 octobre 2016
 
12 Takam Tchendjou G., Alhakim R., Simeu E., Lebowsky F., Evaluation of machine learning algorithms for image quality assessment, International Symposium on On-Line Test and Robust System Design (IOLTS 2016), pp. 193-194, Sant Feliu de Guixols, SPAIN, DOI: 10.1109/IOLTS.2016.7604697, 4 au 6 juillet 2016
 
13 Alhakim R., Takam Tchendjou G., Simeu E., Lebowsky F., Image quality assessment using nonlinear learning methods, IEEE International Conference in Microelectronics (ICM 2015), pp. 5-8, Casablanca, MOROCCO, DOI: 10.1109/ICM.2015.7437973, 20 au 23 décembre 2015
 
14 Tchuani Tchakonte D., Simeu E., Tchuente M., Adaptive healing procedure for lifetime improvement in Wireless Sensor Networks, IEEE 21st International On-Line Testing Symposium (IOLTS'2015), pp. 59–64, Elia, Halkidiki, GREECE, DOI: 10.1109/IOLTS.2015.7229833, 6 au 8 juillet 2015
 
15 Le Gall H., Alhakim R., Valka M., Mir S., Stratigopoulos H., Simeu E., High Frequency Jitter Estimator for SoCs, 20th IEEE European Test Symposium (ETS'15), Cluj-Napoca, ROMANIA, DOI: 10.1109/ETS.2015.7138760, 25 au 29 mai 2015
 
16 Alhakim R., Simeu E., Efficient tracking design in UWB communication systems , IEEE International Conference on Ultra-Wideband (ICUWB'14), pp. 211-216, Paris, FRANCE, DOI: 10.1109/ICUWB.2014.6958980, 1 au 3 septembre 2014
 
17 Andraud M., Deluthault A., Dieng M., Azais F., Bernard S., Cauvet P., Comte M., Kervaon T., Kerzerho V., Mir S., Pugliesi-Conti P., Renovell M., Soulier F., Simeu E., Stratigopoulos H., Solutions for the self-adaptation of communicating systems in operation, IEEE International On-line Test Symposium (IOLTS'14), pp. 234-239, Platja d’Aro, SPAIN, DOI: 10.1109/IOLTS.2014.6873705, 7 au 9 juillet 2014
 
18 Andraud M., Stratigopoulos H., Simeu E., One-shot calibration of RF circuits based on non-intrusive sensors, Design Automation Conference (DAC'14), pp. 1-6, San Francisco, CA, UNITED STATES, DOI: 10.1109/DAC.2014.6881337, 1 au 5 juin 2014
 
19 Ekobo Akoa B., Simeu E., Lebowsky F., Using statistical analysis and artificial intelligence tools for automatic assessment of video sequences, Color Imaging XIX: Displaying, Processing, Hardcopy, and Applications, pp. 1-11, San Francisco, California, UNITED STATES, DOI: 10.1117/12.2044797, 2 au 6 février 2014
 
20 Alhakim R., Simeu E., Fast-tracking delay-locked loop for UWB communication systems , International Conference on Microelectronics (ICM'13), pp. 1-4, Beirut, LEBANON, DOI: 10.1109/ICM.2013.6734971, 15 au 18 décembre 2013
 
21 Ekobo Akoa B., Simeu E., Lebowsky F., Using Classification for Video Quality Evaluation, IEEE International Conference on Microelectronics (ICM'13), pp. 1-4, Beirut, LEBANON, DOI: 10.1109/ICM.2013.6734964, 15 au 18 décembre 2013
 
22 Ekobo Akoa B., Simeu E., Lebowsky F., Video decoder monitoring using non-linear regression, IEEE 19th International On-Line Testing Symposium (IOLTS'13), pp. 175 - 178 , Chania, GREECE, DOI: 10.1109/IOLTS.2013.6604073, 8 au 10 juillet 2013
 
23 Bousquet L., Simeu E., System-level modeling of electromechanical devices with energy consumption, 7th International IEEE Systems Conference (Syscon'13), pp. 756-761, Orlando, Florida, UNITED STATES, DOI: 10.1109/SysCon.2013.6549968, 15 au 18 avril 2013
 
24 Ekobo Akoa B., Simeu E., Lebowsky F., Using Artificial Neural Network for Automatic Assessment of Video Sequences , 27th International Conference on Advanced Information Networking and Applications Workshops (WAINA'13), pp. 285-290, Barcelona, SPAIN, DOI: 10.1109/WAINA.2013.191, 25 au 28 mars 2013
 
25 Bousquet L., Simeu E., High-level Modeling of Power Consumption in Active Linear Analog Circuits, 22nd Great Lakes Symposium on Very Large Scale Integration (GLSVLSI'12), pp. 87-90, Salt Lake City, Utah, UNITED STATES, DOI: 10.1145/2206781.2206804, 3 au 4 mai 2012
 
26 Akkouche N., Mir S., Simeu E., Slamani M., Analog/RF test ordering in the early stages of production testing , 30th IEEE VLSI Test Symposium (VTS'12), pp. 25-30 , Hawaii, UNITED STATES, DOI: 10.1109/VTS.2012.6231075, 23 au 25 avril 2012
 
27 Alhakim R., Raoof K., Simeu E., Design of Tracking Loop for UWB Systems, International Conference on Information Processing and Wireless Systems (IP-WIS'12), pp. 1-5, Sousse, TUNISIA, 16 au 18 mars 2012
 
28 Cenni F., Scotti S., Simeu E., A SystemC AMS/TLM platform for CMOS video sensors , IEEE Conference on Design and Architectures for Signal and Image Processing (DASIP’11), pp. 1-6, Tampere, FINLAND, DOI: 10.1109/DASIP.2011.6136873 , 2 au 4 novembre 2011
 
29 Cenni F., Scotti S., Simeu E., SystemC-AMS behavioral modeling of a CMOS video sensor, 19th IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC’11), pp. 380 - 385 , Hong Kong, CHINA, DOI: 10.1109/VLSISoC.2011.6081614 , 3 au 5 octobre 2011
 
30 Alhakim R., Raoof K., Simeu E., Serrestou Y., Data-aided timing estimation in UWB communication systems using dirty templates, IEEE International Conference on Ultra Wideband (ICUWB’11), pp. 435 - 439 , Bologna, ITALY, DOI: 10.1109/ICUWB.2011.6058880 , 14 au 16 septembre 2011
 
31 Cenni F., Scotti S., Simeu E., Behavioral modeling of a CMOS video sensor platform using SystemC AMS / TLM, IEEE Forum for Design Languages (FDL’11), pp. 1-6, Oldenburg, GERMANY, 13 au 15 septembre 2011
 
32 Alhakim R., Simeu E., Raoof K., Internal model control for a self-tuning Delay-Locked Loop in UWB communication systems , 17th IEEE International On-Line Testing Symposium (IOLT’11), pp. 121 - 126 , Athens, GREECE, DOI: 10.1109/IOLTS.2011.5993822 , 13 au 15 juillet 2011
 
33 Bousquet L., Cenni F., Simeu E., SystemC-AMS high-level modeling of linear analog blocks with power consumption information, IEEE 12th IEEE Latin American Test Workshop (LATW’11), pp. 1-6, Porto de Galinhas, BRAZIL, DOI: 10.1109/LATW.2011.5985924 , 27 au 30 mars 2011
 
34 Khereddine R., Abdallah L., Simeu E., Mir S., Cenni F., Adaptive Logical Control of RF LNA performances for efficient energy consumption, 18th IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC'10), pp. 161-166, Madrid, SPAIN, 27 au 29 septembre 2010
 
35 Alhakim R., Raoof K., Simeu E., A Novel Fine Synchronization Method for Dirty Template UWB Timing Acquisition, 6th International Conference on Wireless Communications Networking and Mobile Computing (WiCOM'10), pp. 4 p., Chengdu, CHINA, 23 au 25 septembre 2010
 
36 Akkouche N., Mir S., Simeu E., Ordering of analog specification tests based on parametric defect level estimation, 28th IEEE VLSI Test Symposium (VTS'10), pp. 301 - 306 , Santa Cruz, UNITED STATES, DOI: 10.1109/VTS.2010.5469546 , 19 au 22 avril 2010
 
37 Rehder G.P., Mir S., Rufer L., Simeu E., Nguyen H.N., Low Frequency Test for RF MEMS Switches, IEEE International Symposium on Electronic Design, Test and Applications (DELTA’10), pp. 350-354, Ho Chi Minh City, VIET NAM, DOI: 10.1109/DELTA.2010.16 , 13 au 15 janvier 2010
 
38 Cenni F., Simeu E., Mir S., Macro-modeling of analog blocks for SystemC-AMS simulation: A chemical sensor case-study, 17th IFIP International Conference on Very Large Scale Integration (VLSI-SoC’09), Florianapolis, BRAZIL, 12 octobre 2009
 
39 Khereddine R., Simeu E., Mir S., Parameter identification of RF transceiver blocks using regressive models, IFAC Workshop on Programmable Devices and Embedded Systems (PDeS’09), pp. 67-72, Roznov pod Radhostem, CZECH REPUBLIC, 1 au 12 février 2009
 
40 Kupka R., Simeu E., Stratigopoulos H., Rufer L., Mir S., Tumova O., Signature analysis for MEMS pseudorandom testing using neural networks, 12th IMEKO TC1 & TC7 Joint Symposium on Man Science & Measurement, pp. 321-325, Annecy, FRANCE, 3 au 5 septembre 2008
 
41 Khereddine R., Simeu E., Mir S., RF transceiver parameter identification using regressive models, International Conference on Design and Technology of Integrated Systems (DTIS’08), pp. 166, Tozeur, TUNISIA, DOI: 10.1109/DTIS.2008.4540208 , 25 au 27 mars 2008
 
42 Akkouche N., Bounceur A., Mir S., Simeu E., Minimization of functional tests by statistical modelling of analogue circuits, International Conference on Design and Technology of Integrated Systems (DTIS’07), pp. 35-40, Rabat, MOROCCO, 2 au 5 septembre 2007
 
43 Simeu E., Mir S., Khereddine R., Nguyen H.N., Envelope detection based transition time supervision for online testing of RF MEMS switches, IEEE International On-Line Test Symposium (IOLT’07), pp. 237-243, Crete, GREECE, DOI: 10.1109/IOLTS.2007.30, 8 au 11 juillet 2007
 
44 Akkouche N., Bounceur A., Mir S., Simeu E., Functional test compaction by statistical modelling of analogue circuits, 13th IEEE International Mixed-Signals Testing Workhop (IMSTW’07), pp. 20-24, Porto, PORTUGAL, 18 au 20 juin 2007
 
45 Simeu E., Nguyen H.N., Cauvet P., Mir S., Rufer L., Khereddine R., Using signal envelope detection for RF MEMS switch testing, 13th IEEE International Mixed-Signals Testing Workhop (IMSTW’07), pp. 68-73, Porto, PORTUGAL, 18 au 20 juin 2007
 
46 Bounceur A., Mir S., Simeu E., Rolindez L., CAT platform for analogue and mixed-signal test evaluation and optimization , 14th IFIP International Conference on Very Larage Scale Integration (VLSI-SoC’06), pp. 320-325, Nice, FRANCE, 16 au 18 octobre 2006
 
47 Bounceur A., Mir S., Simeu E., Rolindez L., Estimation of test metrics for multiple analogue parametric deviations, International Conference on Design and Technology of Integrated Systems (DTIS'06), pp. 234-239, Tunis, TUNISIA, 5 au 7 septembre 2006
 
48 Bounceur A., Mir S., Rolindez L., Simeu E., On the accurate estimation of test metrics for multiple analogue parametric deviations, 12th International Mixed-Signals Testing Workshop (IMSTW’06), pp. 19-26, Edinburgh, UNITED KINGDOM, 21 au 23 juin 2006
 
49 Simeu E., Mir S., Parameter identification based diagnosis in linear and non-linear mixed-signal systems , International Mixed-Signals Testing Workshop (IMSTW'05), pp. 140-147, Cannes, FRANCE, 27 au 29 juin 2005
 
50 Bounceur A., Mir S., Simeu E., Optimisation of digitally coded test vectors for mixed-signal components, 19th Conference on Design of Circuits and Integrated Systems (DCIS'04), Bordeaux, FRANCE, 24 au 26 novembre 2004
 
51 Naal M. A., Simeu E., Mir S., Comparative study of online testing methods for AMS application to decimation filters, International Conference on Information and Communication Technologies: From Theory to Applications (ICTTA'04), pp. 393-394, Damascus, SYRIAN ARAB REPUBLIC, DOI: 10.1109/ICTTA.2004.1307797, 1 janvier 2004
 
52 Rufer L., Mir S., Domingues C., Simeu E., MLS-based technique for MEMS characterization , 3rd International Workshop on Microfabricated Ultrasonic Transducers (MUT'03), pp. 157-164, Lausanne, SWITZERLAND, 26 au 27 juin 2003
 
53 Rufer L., Mir S., Simeu E., Domingues C., On-chip pseudorandom MEMS testing, 9th International Mixed-Signal Testing Workshop (IMSTW'03), pp. 93-98, Sevilla, SPAIN, 25 au 27 juin 2003
 
54 Rufer L., Mir S., Simeu E., Domingues C., On-chip testing of MEMS using pseudo-random test sequences, Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP'03) , pp. 50-55, Mandelieu (Cannes), FRANCE, DOI: 10.1109/DTIP.2003.1287007, 5 au 7 mai 2003
 
55 Rufer L., Mir S., Simeu E., On-chip testing of linear time invariant systems using maximum length sequences, IFAC Workshop on Programmable Devices and Systems (PDS'03), pp. 437-440, Ostrava, CZECH REPUBLIC, 11 au 13 février 2003
 
56 Naal M. A., Simeu E., Mir S., On-Line Testable Decimation Filter Design for AMS Systems, 9th IEEE International On-Line Testing Symposium (IOLT'03), pp. 83-88, Kos Island, GREECE, DOI: 10.1109/OLT.2003.1214371, 1 janvier 2003
 
57 Naal M. A., RAKOTOARISOA M.N., Simeu E., Aktouf C., Using concurrent and semi-concurrent on-line testing during HLS: an adaptable approach, Eighth IEEE International On Line Testing Workshop (IOLTW'02), pp. 184, Ile de Bendor, GREECE, DOI: 10.1109/OLT.2002.1030208, 8 au 10 juillet 2002
 
58 Simeu E., Abdelhay A., Naal M. A., Robust self concurrent test of linear digital systems, 10th Asian Test Symposium (ATS'01), pp. 293-298, Kyoto, JAPAN, DOI: 10.1109/ATS.2001.990298, 19 au 21 novembre 2001
 
59 Simeu E., Abdelhay A., A robust fault detection scheme for concurrent testing of linear digital systems, Seventh International On Line Testing Workshop (IOLTW'01), pp. 209-214, Taormina, ITALY, DOI: 10.1109/OLT.2001.937844, 9 au 11 juillet 2001
 
60 Simeu E., Peters A.W., Rayane I., Symbolic modeling for fault detection and isolation : application to linear analog systems, 16th IMACS World Congress on Scientific Computation, Modeling and Applied Mathematics, Lausanne, SWITZERLAND, 21 au 25 août 2000
 
61 Abdelhay A., Simeu E., Analytical redundancy based approach for concurrent fault detection in linear digital systems, 6th IEEE International On Line Testing Workshop (IOLTW'00), pp. 112-117, Palma de Mallorca, SPAIN, DOI: 10.1109/OLT.2000.856622, 3 au 5 juillet 2000
 
62 Naal M. A., Simeu E., High level synthesis methodology for on-line testability optimization, 6th IEEE International On Line Testing Workshop (IOLTW'00), pp. 201-206, Palma de Mallorca, SPAIN, DOI: 10.1109/OLT.2000.856637, 3 au 5 juillet 2000
 
63 Simeu E., Peters A.W., Robust model-based concurrent fault detection - application to linear analog systems, 6th IEEE International Mixed-Signal Testing Workshop (IMSTW'00), Montpellier, FRANCE, 21 au 23 juin 2000
 
64 Simeu E., Peters A.W., Rayane I., Extended state modeling for concurrent testing of linear analog systems, 5th International On-Line Testing Workshop (IOLTW'99), Rhodes Island, GREECE, 5 au 7 juillet 1999
 
65 Simeu E., Peters A.W., Rayane I., Automatic design of optimal concurrent fault detector for linear analog systems, Digest of Papers. Twenty Ninth Annual Internationa Symposium on Fault Tolerant-Computing (FTCS'99), pp. 184-191, Madison, Wisconsin, UNITED STATES, DOI: 10.1109/FTCS.1999.781049, 15 au 18 juin 1999
 
66 Simeu E., Residual checking method for concurrent fault detection in linear analog systems, 4th IEEE International On-Line Testing Workshop (IOLTW'98), Capri, ITALY, 6 au 8 juillet 1998
 
67 Kamga A., Simeu E., A good choice of a path following controller for an industrial mobile robot, IEEE International Conference on Control Applications (CCA'97), pp. 16-21, Hartford, CT , UNITED STATES, DOI: 10.1109/CCA.1997.627456, 5 au 7 octobre 1997
 
68 Simeu E., Herve T., Linear and nonlinear modelling for fault detection and identification, IFAC Conference on Control of Industrial Systems. "Control for the Future of the Youth". , pp. 969-975, Belfort, FRANCE, 20 au 22 mai 1997
 
69 Simeu E., Application of NARMAX modelling to eddy current brake process, 4th IEEE Conference on Control Applications (CCA'95), pp. 444-449, Albany, NY , UNITED STATES, DOI: 10.1109/CCA.1995.555744, 28 au 29 septembre 1995
 
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3 Chapitres de livre

1 Khereddine R., Abdallah L., Simeu E., Mir S., Cenni F., Adaptive logical control of RF LNA performances for efficient energy consumption, in VLSI-SoC: Forward-Looking Trends in IC and Systems Design , J. Ayala, D. Atienza, R. Reis (Eds.) , Ed. Springer , pp. 43-68, Volume 373, DOI: DOI: 10.1007/978-3-642-28566-0_3, 2012
 
2 Alhakim R., Raoof K., Simeu E., Timing Synchronisation for IR-UWB Communication Systems, Ultra Wideband - Current Status and Future Trends, M. A. Matin (Eds.) , Ed. InTech Europe, Rijeka, Croatia, pp. 15-40, 2012
 
3 Bounceur A., Mir S., Rolindez L., Simeu E., CAT platform for analogue and mixed-signal test evaluation and optimization, in VLSI-SoC: Research trends in VLSI and Systems on Chip, G. De Micheli, S. Mir, R. Reis (Eds.) , Ed. Springer , pp. 281-300, Vol. 249, 2007
 
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4 Livres & Éditions Ouvrages

1 Simeu E., Jurimagi L., Velazco R. (Eds.) Proceedings of the 20th Latin-American Test Symposium (LATS 2019), Ed. IEEE, 2019
 
2 Alhakim R., Raoof K., Simeu E. (Eds.) Optimizing the performance of synchronization process: in ultra-wideband communication systems, pp. 1-284, Ed. LAMBERT Academic Publishing (LAP), 2013
 
3 Simeu E., Mir S., De Micheli G., Reis R. (Eds.) Digest of Papers PhD Forum at 14th IFIP International Conference on Very Large Scale Integration (VLSI-SoC), pp. 83 pages, Ed. IFIP, 2006
 
4 Mir S., De Micheli G., Reis R., Simeu E. (Eds.) Proceedings 14th IFIP International Conference on Very Large Scale Integration (VLSI-SoC’06), pp. 416 p., Ed. IFIP, 2006
 
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8 Conférences nationales

1 Alhakim R., Simeu E., Novel design of tracking process for UWB communication systems, IEEE AFRICON 2013, Pointe-Aux-Piments, MAURITIUS, DOI: 10.1109/AFRCON.2013.6757755, 9 au 12 septembre 2013
 
2 Alhakim R., Simeu E., Raoof K., A novel design for delay-locked loop using internal model control approach, Journées scientifiques du projet SEmba 2013, Lyon, FRANCE, 4 au 5 avril 2013
 
3 Bousquet L., Simeu E., Including power consumption information in SystemC-AMS modeling of linear analog blocks at LSF MoC Level, Journées GDR SoC-SiP, Lyon, FRANCE, 15 au 17 juin 2011
 
4 Akkouche N., Mir S., Simeu E., Stratigopoulos H., Réduction de tests fonctionnels en utilisant des techniques d'estimation non paramétrique, 11ème Journées Nationales du Réseau Doctoral en Microélectronique (JNRDM’08), Bordeaux, FRANCE, 14 au 16 mai 2008
 
5 Khereddine R., Simeu E., Mir S., Utilisation des modèles de regression pour l’identification des paramètres d’un transceiver RF, 11ème Journées Nationales du Réseau Doctoral en Microélectronique (JNRDM’08), Bordeaux, FRANCE, 14 au 16 mai 2008
 
6 Nguyen H.N., Rufer L., Simeu E., Mir S., RF MEMS series capacitive switch: test and diagnosis, Journées GDR SoC-SiP, Paris, FRANCE, 13 au 15 juin 2007
 
7 Khereddine R., Simeu E., Mir S., Utilisation des techniques de regression pour le test et le diagnostic des composantes RF , Journées GDR SoC-SiP, Paris, FRANCE, 13 juin 2007
 
8 Bounceur A., Mir S., Simeu E., Génération et optimisation de vecteurs de test pour des composants analogiques et mixtes, 7ème Journées Nationales du Réseau Doctoral de Microélectronique (JNRDM'04), pp. 198-200, Marseille, FRANCE, 4 au 6 mai 2004
 
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5 Autres communications

1 Troussier C., Bourgeat J., Simeu E., Arnould J.D., Jimenez J., Jacquier B., Study of Inter-Power Domain Failures during a CDM Event, IEEE 42nd EOS/ESD symposium (ESDA 2020), Virginia St, Reno, UNITED STATES, 2020
 
2 Cenni F., Scotti S., Simeu E., SystemC-AMS model of a CMOS video sensor. Open SystemC Initiative (OSCI) , SystemC AMS Day 2011: Industry Adoption of the SystemC AMS Standard, pp. 42-49, Dresden, GERMANY, 2011
 
3 Bounceur A., Mir S., Rolindez L., Simeu E., A CAT platform for analogue and mixed-signal test evaluation and optimization , Digest of Papers of the IEEE European Test Symposium (ETS’06), pp. 217-222, Southampton, UNITED KINGDOM, 2006
 
4 Nguyen H.N., Simeu E., Rufer L., Mir S., Use of regressive method for RF MEMS test and diagnosis, PhD Forum at International Conference on Very Large Scale Integration (VLSI-Soc'06), pp. 56-61, Nice, FRANCE, 2006
 
5 Rufer L., Simeu E., Mir S., Built-in self-test of linear time invariant systems using maximum-length sequences, Poster at IEEE European Test Workshop (ETW'03), pp. 111-112, Maastricht, NETHERLANDS, 2003
 
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14 Rapports

 1 Bounceur A., Simeu E., Mir S., Rolindez L., Estimation of test metrics for the optimisation of analogue circuit testing , ISRN: TIMA-RR--06/10-03--FR, 1 janvier 2006
 
 2 Simeu E., Mir S., Diagnosis in Linear and Nonlinear Mixed-Signal Systems: a Parameter Identification Based Technique, ISRN: TIMA-RR--05/06-01--FR, 1 janvier 2005
 
 3 Naal M. A., Mir S., Simeu E., Comparative Study of On-Line Testing Methods for AMS Systems. Application to Decimation Filters, ISRN: TIMA-RR--04/05-02--FR, 1 janvier 2004
 
 4 Mir S., Bounceur A., Simeu E., Génération et optimisation de vecteurs de test pour des composants analogiques et mixtes, ISRN: TIMA-RR--04/05-04--FR, 1 janvier 2004
 
 5 Simeu E., Mir S., Rufer L., Online Testing Embedded Systems: Adapting Automatic Control Techniques to Microelectronic Testing , ISRN: ISRN-RR--04/09-01-FR, 1 janvier 2004
 
 6 Simeu E., Rufer L., Mir S., Built-in-self -test of linear time invariant systems using maximum - lenght sequences, ISRN: TIMA-RR--03/07-02--FR, 1 janvier 2003
 
 7 Rufer L., Simeu E., Mir S., Domingues C., On-chip pseudorandom MEMS testing, ISRN: TIMA-RR--03/06-01--FR, 1 janvier 2003
 
 8 Rufer L., Mir S., Simeu E., On-chip testing of linear time invariant systems using maximum-length sequences, ISRN: TIMA-RR--03/01-01--FR, 1 janvier 2003
 
 9 Rufer L., Simeu E., Mir S., Domingues C., On-Chip testing of MEMS using pseudo-random test sequences, ISRN: TIMA-RR--03/03-02--FR, 1 janvier 2003
 
10 Naal M. A., Mir S., Simeu E., On-Line Testable Design: Application to Decimation Filter for AMS Systems, ISRN: TIMA-RR--03/08-01--FR, 1 janvier 2003
 
11 Naal M. A., Simeu E., On­Line Testability Optimization in High Level Synthesis, ISRN: TIMA-RR--00/04-1--FR, 1 janvier 2000
 
12 Simeu E., Peters A.W., Rayane I., Detection Circuit Design for Concurrent Testing of Linear Analog Systems, ISRN: TIMA-RR--99/04-4--FR, 1 janvier 1999
 
13 Simeu E., Mesure de testabilité pour la synthèse de haut niveau, ISRN: TIMA-RR--99/04-2--FR, 1 janvier 1999
 
14 Abdelhay A., Simeu E., Méthode généralisée de test en ligne des systèmes digitaux linéaires, ISRN: TIMA-RR--99/04-1--FR, 1 janvier 1999
 
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1 Thèses

1 Simeu E., Off-Line and On-Line BIST for Embedded Systems, HDR, 22 septembre 2005
 
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