Publications

Publications

Recherche

Recherche

Auteur
hors TIMA
Équipe :

Mot clé
Type de publications
Tous
Sélectionne/déselectionne tous les types de publications
Journal art.
International National Tous
 Brevets  Conférences invitées
Conference art.
International National Tous
Chapitres de livre  Livres & Éditions Ouvrages
 Autres communications
 Logiciels  Thèses
 
 année
 

26 résultats

   9 Revues internationales
   2 Conférences invitées
  14 Conférences internationales
   1 Chapitres de livre

9 Revues internationales

1 Vatajelu I., Di Natale G., High-Entropy STT-MTJ-based TRNG, IEEE Transactions on Very Large Scale Integration (VLSI) Systems , Ed. IEEE, Vol. , DOI: 10.1109/TVLSI.2018.2879439, 2019
 
2 Kooli M., Di Natale G., Bosio A., Memory-Aware Design Space Exploration for Reliability Evaluation in Computing Systems, Journal of Electronic Testing: Theory and Applications, Ed. Springer , Vol. , DOI: 10.1007/s10836-019-05785-0, mars 2019
 
3 Martin H., Peris-Lopez P., Di Natale G., Taouil M., Hamdioui S., Enhancing PUF Based Challenge-Response Sets by Exploiting Various Background Noise Configurations, MDPI Electronics, Ed. MDPI, Vol. 8, No. 2, DOI: 10.3390/electronics8020145, janvier 2019
 
4 Dutertre J.M., Beroulle V., Candelier P., De Castro S., Faber L.-B., Flottes M.-L., Gendrier P., Hély D., Leveugle R., Maistri P., Di Natale G., Papadimitriou A., Sensitivity to Laser Fault Injection: CMOS FD-SOI vs. CMOS bulk (Early Access), IEEE Transactions on Device and Materials Reliability, Vol. , DOI: 10.1109/TDMR.2018.2886463, décembre 2018
 
5 Andreoni Camponogara Viera R., Dutertre J.M., Potin O., Flottes M.-L., Di Natale G., Rouzeyre B., Possamai Bastos R., Assessing Body Built-In Current Sensors for Detection of Multiple Transient Faults, Microelectronics Reliability, Ed. Elsevier, Vol. 88-90, pp. 128-134, DOI: 10.1016/j.microrel.2018.07.111, septembre 2018
 
6 Dutertre J.M., Possamai Bastos R., Potin O., Flottes M.-L., Rouzeyre B., Di Natale G., Sarafianos A., Improving the ability of Bulk Built-In Current Sensors to detect SEEs by using triple-well CMOS, Microelectronics Reliability, Ed. Elsevier, Vol. 54, No. 9–10, pp. 2289–2294, DOI: 10.1016/j.microrel.2014.07.151, septembre 2014
 
7 Dutertre J.M., Possamai Bastos R., Potin O., Flottes M.-L., Rouzeyre B., Di Natale G., Sensitivity tuning of a bulk built-in current sensor for optimal transient-fault detection, Microelectronics Reliability, Ed. Elsevier, Vol. 53, Issues 9–11, September–November , pp. 1320–1324, DOI: http://dx.doi.org/10.1016/j.microrel.2013.07.069, septembre 2013
 
8 Possamai Bastos R., Di Natale G., Flottes M.-L., Lu F., Rouzeyre B., A New Recovery Scheme Against Short-to-Long Duration Transient Faults in Combinational Logic, Journal of Electronic Testing: Theory and Applications, Ed. Springer , Vol. 29, No. 3, pp. 331-340, DOI: 10.1007/s10836-013-5359-y, juin 2013
 
9 Possamai Bastos R., Torres F.S., Di Natale G., Flottes M.-L., Rouzeyre B., Novel transient-fault detection circuit featuring enhanced bulk built-in current sensor with low-power sleep-mode, Microelectronics Reliability, Ed. Elsevier, Vol. 52, No. 9-10, pp. 1781–1786, DOI: 10.1016/j.microrel.2012.06.149, septembre 2012
 
remonter

2 Conférences invitées

1 Di Natale G., Kooli M., Bosio A., Portolan M., Leveugle R., Reliability of computing systems: from flip flops to variables, Invited talk (Special Session), 23rd IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2017), Thessaloniki, GREECE, DOI: 10.1109/IOLTS.2017.8046242, 3 au 5 juillet 2017
 
2 Di Natale G., Flottes M.-L., Rouzeyre B., Maistri P., Leveugle R., Ensuring High Testability without Degrading Security, Embedded tutorial, European Test Symposium (ETS’09), Sevilla, SPAIN, 25 au 29 mai 2009
 
remonter

14 Conférences internationales

 1 Leveugle R., Portolan M., Di Carlo S., Savino A., Di Natale G., Bosio A., Alternatives to fault injections for early safety/security evaluations, 24th IEEE European Test Symposium (ETS 2019), Baden Baden, GERMANY, 27 au 31 mai 2019
 
 2 Anghel L., Di Natale G., Miramond B., Vatajelu I., Vianello E., Neuromorphic Computing - From Robust Hardware Architectures to Testing Strategies, 26th IFIP IEEE International Conference on Very Large Scale Integration (VLSI SOC 2018), Verona, ITALY, 8 au 10 octobre 2018
 
 3 Andreoni Camponogara Viera R., Dutertre J.M., Potin O., Flottes M.-L., Di Natale G., Rouzeyre B., Possamai Bastos R., Assessing Body Built-In Current Sensors for Detection of Multiple Transient Faults, European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF'2018), Aalborg, DENMARK, 1 au 5 octobre 2018
 
 4 Dutertre J.M., Beroulle V., Candelier P., De Castro S., Faber L.-B., Flottes M.-L., Gendrier P., Hély D., Leveugle R., Maistri P., Di Natale G., Papadimitriou A., Rouzeyre B., Laser Fault Injection at the CMOS 28 nm Technology Node: an Analysis of the Fault Model, Fourteenth Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC'2018), Amsterdam, NETHERLANDS, 13 septembre 2018
 
 5 Dutertre J.M., Beroulle V., Candelier P., De Castro S., Faber L.-B., Flottes M.-L., Gendrier P., Hély D., Leveugle R., Maistri P., Di Natale G., Papadimitriou A., Rouzeyre B., The case of using CMOS FD-SOI rather than CMOS bulk to harden ICs against laser attacks, 24th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS'2018), Platja d'Aro, SPAIN, 2 au 4 juillet 2018
 
 6 Vatajelu I., Di Natale G., Prinetto P., Zero bit-error-rate weak PUF based on Spin-Transfer-Torque MRAM memories, 2017 IEEE 2nd International Verification and Security Workshop (IVSW 2017), pp. 128-133, Thessaloniki, GREECE, DOI: 10.1109/IVSW.2017.8031552, 3 au 7 juillet 2017
 
 7 Andreoni Camponogara Viera R., Possamai Bastos R., Dutertre J.M., Potin O., Flottes M.-L., Di Natale G., Rouzeyre B., Validation of Single BBICS Architecture in Detecting Multiple Faults, IEEE Asian Test Symposium (ATS'15), Bombay, INDIA, 23 au 25 novembre 2015
 
 8 Leveugle R., Maistri P., Vanhauwaert P., Lu F., Di Natale G., Flottes M.-L., Rouzeyre B., Papadimitriou A., Hély D., Beroulle V., Hubert G., De Castro S., Dutertre J.M., Sarafianos A., Boher N., Lisart M., Damiens J., Candelier P., Tavernier C., Laser-induced fault effects in security-dedicated circuit, 22nd IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC'14), pp. 201-206, Playa del Carmen , MEXICO, DOI: 10.1109/VLSI-SoC.2014.7004184 , 5 au 8 octobre 2014
 
 9 Dutertre J.M., Possamai Bastos R., Potin O., Flottes M.-L., Rouzeyre B., Di Natale G., Design of Bulk Built-In Current Sensors to Detect Single Event Effects and Laser-Induced Fault Injection Attempts, Workshop on Trustworthy Manufacturing and Utilization of Secure Devices (TRUDEVICE'14), Paderborn, GERMANY, 29 au 30 mai 2014
 
10 Dutertre J.M., Possamai Bastos R., Potin O., Flottes M.-L., Rouzeyre B., Di Natale G., Sensitivity tuning of a bulk built-in current sensor for optimal transient-fault detection, European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF'13), Arcachon, FRANCE, 30 septembre au 4 octobre 2013
 
11 Possamai Bastos R., Torres F.S., Dutertre J.M., Flottes M.-L., Di Natale G., Rouzeyre B., A Single Built-in Sensor to Check Pull-up and Pull-down CMOS Networks against Transient Faults, International Workshop on Power and Timing Modeling, Optimization and Simulation (PATMOS'13), Karlsruhe, GERMANY, 9 au 11 septembre 2013
 
12 Possamai Bastos R., Torres F.S., Dutertre J.M., Flottes M.-L., Di Natale G., Rouzeyre B., A Bulk Built-in Sensor for Detection of Fault Attacks, International Symposium on Hardware Oriented Security and Trust (HOST'13), pp. 51-54, Austin, TX, UNITED STATES, DOI: 10.1109/HST.2013.6581565, 2 au 3 juin 2013
 
13 Possamai Bastos R., Torres F.S., Di Natale G., Flottes M.-L., Rouzeyre B., Novel transient-fault detection circuit featuring enhanced bulk built-in current sensor with low-power sleep-mode, 23rd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF'12), Cagliari, ITALY, 1 au 5 octobre 2012
 
14 Possamai Bastos R., Di Natale G., Flottes M.-L., Rouzeyre B., How to Sample Results of Concurrent Error Detection Schemes in Transient Fault Scenarios?, 12th European Conference on Radiation and Its Effects on Components and Systems (RADECS'11), pp. 635-642, Sevilla, SPAIN, DOI: 10.1109/RADECS.2011.6131361, 22 au 23 septembre 2011
 
remonter

1 Chapitres de livre

1 Beroulle V., Candelier P., De Castro S., Di Natale G., Dutertre J.M., Flottes M.-L., Hély D., Hubert G., Leveugle R., Lu F., Maistri P., Papadimitriou A., Rouzeyre B., Tavernier C., Vanhauwaert P., Laser-induced fault effects in security-dedicated circuits, VLSI-SoC: Internet of Things Foundations, L. Claesen, M.-T. Sanz-Pascual, R. Reis, A. Sarmiento-Reyes (Eds.) , Ed. Elsevier, pp. 220-240, Vol. 464, 2015
 
remonter