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42 résultats

  13 Revues internationales
   2 Conférences invitées
  23 Conférences internationales
   1 Chapitres de livre
   3 Autres communications

13 Revues internationales

 1 Di Natale G., Bolchini C., Holding Conferences Online due to COVID-19: The DATE Experience, IEEE Design & Test, Ed. IEEE, Vol. 37, No. 3, pp. 116-118, DOI: 10.1109/MDAT.2020.2995140, juin 2020
 
 2 Valea E., Da Silva M., Di Natale G., Flottes M.-L., Rouzeyre B., A Survey on Security Threats and Countermeasures in IEEE Test Standards, IEEE Design & Test, Ed. IEEE, Vol. 36, No. 3, pp. 95-116, DOI: 10.1109/MDAT.2019.2899064, juin 2019
 
 3 Vallero A., Savino A., Chatzidimitriou A., Kaliorakis M., Kooli M., Riera V., Di Natale G., Bosio A., Canal R., Gizopoulos D., Di Carlo S., Early System Reliability Analysis for Cross-layer Soft Errors Resilience in Memory Arrays of Microprocessor Systems, IEEE Transactions on Computers, Ed. IEEE, Vol. 68, No. 5, pp. 765-783, DOI: 10.1109/TC.2018.2887225, mai 2019
 
 4 Valea E., Da Silva M., Flottes M.-L., Di Natale G., Rouzeyre B., Stream vs block ciphers for scan encryption, Microelectronics journal, Ed. Elsevier, Vol. 86, pp. 65-76, DOI: 10.1016/j.mejo.2019.02.019, avril 2019
 
 5 Kooli M., Di Natale G., Bosio A., Memory-Aware Design Space Exploration for Reliability Evaluation in Computing Systems, Journal of Electronic Testing: Theory and Applications, Ed. Springer , Vol. , DOI: 10.1007/s10836-019-05785-0, mars 2019
 
 6 Vatajelu I., Di Natale G., High-Entropy STT-MTJ-based TRNG, IEEE Transactions on Very Large Scale Integration (VLSI) Systems , Ed. IEEE, Vol. , DOI: 10.1109/TVLSI.2018.2879439, février 2019
 
 7 Martin H., Peris-Lopez P., Di Natale G., Taouil M., Hamdioui S., Enhancing PUF Based Challenge-Response Sets by Exploiting Various Background Noise Configurations, MDPI Electronics, Ed. MDPI, Vol. 8, No. 2, DOI: 10.3390/electronics8020145, janvier 2019
 
 8 Dutertre J.M., Beroulle V., Candelier P., De Castro S., Faber L.-B., Flottes M.-L., Gendrier P., Hély D., Leveugle R., Maistri P., Di Natale G., Papadimitriou A., Sensitivity to Laser Fault Injection: CMOS FD-SOI vs. CMOS bulk (Early Access), IEEE Transactions on Device and Materials Reliability, Vol. , DOI: 10.1109/TDMR.2018.2886463, décembre 2018
 
 9 Andreoni Camponogara Viera R., Dutertre J.M., Potin O., Flottes M.-L., Di Natale G., Rouzeyre B., Possamai Bastos R., Assessing Body Built-In Current Sensors for Detection of Multiple Transient Faults, Microelectronics Reliability, Ed. Elsevier, Vol. 88-90, pp. 128-134, DOI: 10.1016/j.microrel.2018.07.111, septembre 2018
 
10 Dutertre J.M., Possamai Bastos R., Potin O., Flottes M.-L., Rouzeyre B., Di Natale G., Sarafianos A., Improving the ability of Bulk Built-In Current Sensors to detect SEEs by using triple-well CMOS, Microelectronics Reliability, Ed. Elsevier, Vol. 54, No. 9–10, pp. 2289–2294, DOI: 10.1016/j.microrel.2014.07.151, septembre 2014
 
11 Dutertre J.M., Possamai Bastos R., Potin O., Flottes M.-L., Rouzeyre B., Di Natale G., Sensitivity tuning of a bulk built-in current sensor for optimal transient-fault detection, Microelectronics Reliability, Ed. Elsevier, Vol. 53, Issues 9–11, September–November , pp. 1320–1324, DOI: http://dx.doi.org/10.1016/j.microrel.2013.07.069, septembre 2013
 
12 Possamai Bastos R., Di Natale G., Flottes M.-L., Lu F., Rouzeyre B., A New Recovery Scheme Against Short-to-Long Duration Transient Faults in Combinational Logic, Journal of Electronic Testing: Theory and Applications, Ed. Springer , Vol. 29, No. 3, pp. 331-340, DOI: 10.1007/s10836-013-5359-y, juin 2013
 
13 Possamai Bastos R., Torres F.S., Di Natale G., Flottes M.-L., Rouzeyre B., Novel transient-fault detection circuit featuring enhanced bulk built-in current sensor with low-power sleep-mode, Microelectronics Reliability, Ed. Elsevier, Vol. 52, No. 9-10, pp. 1781–1786, DOI: 10.1016/j.microrel.2012.06.149, septembre 2012
 
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2 Conférences invitées

1 Di Natale G., Kooli M., Bosio A., Portolan M., Leveugle R., Reliability of computing systems: from flip flops to variables, Invited talk (Special Session), 23rd IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2017), Thessaloniki, GREECE, DOI: 10.1109/IOLTS.2017.8046242, 3 au 5 juillet 2017
 
2 Di Natale G., Flottes M.-L., Rouzeyre B., Maistri P., Leveugle R., Ensuring High Testability without Degrading Security, Embedded tutorial, European Test Symposium (ETS’09), Sevilla, SPAIN, 25 au 29 mai 2009
 
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23 Conférences internationales

 1 Di Natale G., Keren O., Nonlinear Codes for Control Flow Checking, IEEE European Test Symposium (ETS 2020), pp. 1-6, Tallinn, ESTONIA, DOI: 10.1109/ETS48528.2020.9131592, 25 au 29 mai 2020
 
 2 Bosio A., Hamdioui S., O'Connor I., Rodrigues G., Lima F., Vatajelu I., Di Natale G., Anghel L., Nagarajan S., Fieback M.R., Rebooting Computing: The Challenges for Test and Reliability, IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT'2019), pp. 8138-8143, Noordwijk, NETHERLANDS, DOI: 10.1109/DFT.2019.8875270 , 2 au 4 octobre 2019
 
 3 Merandat M., Reynaud V., Valea E., Quévremont J., Maistri P., Leveugle R., Flottes M.-L., Dupuis S., Rouzeyre B., Di Natale G., A Comprehensive Approach to a Trusted Test Infrastructure, 4th International Verification and Security Workshop (IVSW 2019), Rhodes Island, GREECE, 1 au 3 juillet 2019
 
 4 Bolchini C., Cassano L., Montalbano I., Reppole G., Zanetti A., Di Natale G., HATE: a HArdware Trojan Emulation Environment for Microprocessor-based Systems, IEEE 25th International Symposium on On-Line Testing And Robust System Design (IOLTS'2019), Rhodes Island, GREECE, 1 au 3 juillet 2019
 
 5 Vatajelu I., Di Natale G., Keren O., Martin H., On the Reliability of the Ring Oscillator Physically Unclonable Functions, IEEE 4th International Verification and Security Workshop (IVSW'2019), pp. 25-30, Rhodes Island, GREECE, DOI: 10.1109/IVSW.2019.8854401, 1 au 3 juillet 2019
 
 6 Portolan M., Savino A., Leveugle R., Di Carlo S., Bosio A., Di Natale G., Alternatives to fault injections for early safety/security evaluations, 24th IEEE European Test Symposium (ETS 2019), Baden Baden, GERMANY, 27 au 31 mai 2019
 
 7 Valea E., Da Silva M., Flottes M.-L., Di Natale G., Rouzeyre B., Encryption-Based Secure JTAG, IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2019), Cluj Napoca, ROMANIA, 24 au 26 avril 2019
 
 8 Vatajelu I., Di Natale G., Anghel L., Special Session: Reliability of Hardware-Implemented Spiking Neural Networks (SNN), IEEE VLSI Test Symposium (VTS 2019), Monterey, UNITED STATES, 23 au 25 avril 2019
 
 9 Valea E., Da Silva M., Flottes M.-L., Di Natale G., Rouzeyre B., Dupuis S., Providing Confidentiality and Integrity in Ultra Low Power IoT Devices, 14th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS 2019), Mykonos, GREECE, DOI: 10.1109/DTIS.2018.8368561, 16 au 18 avril 2019
 
10 Di Natale G., Vatajelu I., Senthamarai Kannan K., Anghel L., Hidden-Delay-Fault Sensor for Test, Reliability and Security, IEEE Design Automation and Test Conference in Europe (DATE 2019), Florence, ITALY, 25 au 29 mars 2019
 
11 Anghel L., Di Natale G., Miramond B., Vatajelu I., Vianello E., Neuromorphic Computing - From Robust Hardware Architectures to Testing Strategies, 26th IFIP IEEE International Conference on Very Large Scale Integration (VLSI SOC 2018), Verona, ITALY, 8 au 10 octobre 2018
 
12 Andreoni Camponogara Viera R., Dutertre J.M., Potin O., Flottes M.-L., Di Natale G., Rouzeyre B., Possamai Bastos R., Assessing Body Built-In Current Sensors for Detection of Multiple Transient Faults, European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF'2018), Aalborg, DENMARK, 1 au 5 octobre 2018
 
13 Dutertre J.M., Beroulle V., Candelier P., De Castro S., Faber L.-B., Flottes M.-L., Gendrier P., Hély D., Leveugle R., Maistri P., Di Natale G., Papadimitriou A., Rouzeyre B., Laser Fault Injection at the CMOS 28 nm Technology Node: an Analysis of the Fault Model, Fourteenth Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC'2018), Amsterdam, NETHERLANDS, 13 septembre 2018
 
14 Dutertre J.M., Beroulle V., Candelier P., De Castro S., Faber L.-B., Flottes M.-L., Gendrier P., Hély D., Leveugle R., Maistri P., Di Natale G., Papadimitriou A., Rouzeyre B., The case of using CMOS FD-SOI rather than CMOS bulk to harden ICs against laser attacks, 24th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS'2018), Platja d'Aro, SPAIN, 2 au 4 juillet 2018
 
15 Vatajelu I., Di Natale G., Prinetto P., Zero bit-error-rate weak PUF based on Spin-Transfer-Torque MRAM memories, 2017 IEEE 2nd International Verification and Security Workshop (IVSW 2017), pp. 128-133, Thessaloniki, GREECE, DOI: 10.1109/IVSW.2017.8031552, 3 au 7 juillet 2017
 
16 Andreoni Camponogara Viera R., Possamai Bastos R., Dutertre J.M., Potin O., Flottes M.-L., Di Natale G., Rouzeyre B., Validation of Single BBICS Architecture in Detecting Multiple Faults, IEEE Asian Test Symposium (ATS'15), Bombay, INDIA, 23 au 25 novembre 2015
 
17 Leveugle R., Maistri P., Vanhauwaert P., Lu F., Di Natale G., Flottes M.-L., Rouzeyre B., Papadimitriou A., Hély D., Beroulle V., Hubert G., De Castro S., Dutertre J.M., Sarafianos A., Boher N., Lisart M., Damiens J., Candelier P., Tavernier C., Laser-induced fault effects in security-dedicated circuit, 22nd IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC'14), pp. 201-206, Playa del Carmen , MEXICO, DOI: 10.1109/VLSI-SoC.2014.7004184 , 5 au 8 octobre 2014
 
18 Dutertre J.M., Possamai Bastos R., Potin O., Flottes M.-L., Rouzeyre B., Di Natale G., Design of Bulk Built-In Current Sensors to Detect Single Event Effects and Laser-Induced Fault Injection Attempts, Workshop on Trustworthy Manufacturing and Utilization of Secure Devices (TRUDEVICE'14), Paderborn, GERMANY, 29 au 30 mai 2014
 
19 Dutertre J.M., Possamai Bastos R., Potin O., Flottes M.-L., Rouzeyre B., Di Natale G., Sensitivity tuning of a bulk built-in current sensor for optimal transient-fault detection, European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF'13), Arcachon, FRANCE, 30 septembre au 4 octobre 2013
 
20 Possamai Bastos R., Torres F.S., Dutertre J.M., Flottes M.-L., Di Natale G., Rouzeyre B., A Single Built-in Sensor to Check Pull-up and Pull-down CMOS Networks against Transient Faults, International Workshop on Power and Timing Modeling, Optimization and Simulation (PATMOS'13), Karlsruhe, GERMANY, 9 au 11 septembre 2013
 
21 Possamai Bastos R., Torres F.S., Dutertre J.M., Flottes M.-L., Di Natale G., Rouzeyre B., A Bulk Built-in Sensor for Detection of Fault Attacks, International Symposium on Hardware Oriented Security and Trust (HOST'13), pp. 51-54, Austin, TX, UNITED STATES, DOI: 10.1109/HST.2013.6581565, 2 au 3 juin 2013
 
22 Possamai Bastos R., Torres F.S., Di Natale G., Flottes M.-L., Rouzeyre B., Novel transient-fault detection circuit featuring enhanced bulk built-in current sensor with low-power sleep-mode, 23rd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF'12), Cagliari, ITALY, 1 au 5 octobre 2012
 
23 Possamai Bastos R., Di Natale G., Flottes M.-L., Rouzeyre B., How to Sample Results of Concurrent Error Detection Schemes in Transient Fault Scenarios?, 12th European Conference on Radiation and Its Effects on Components and Systems (RADECS'11), pp. 635-642, Sevilla, SPAIN, DOI: 10.1109/RADECS.2011.6131361, 22 au 23 septembre 2011
 
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1 Chapitres de livre

1 Beroulle V., Candelier P., De Castro S., Di Natale G., Dutertre J.M., Flottes M.-L., Hély D., Hubert G., Leveugle R., Lu F., Maistri P., Papadimitriou A., Rouzeyre B., Tavernier C., Vanhauwaert P., Laser-induced fault effects in security-dedicated circuits, VLSI-SoC: Internet of Things Foundations, L. Claesen, M.-T. Sanz-Pascual, R. Reis, A. Sarmiento-Reyes (Eds.) , Ed. Elsevier, pp. 220-240, Vol. 464, 2015
 
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3 Autres communications

1 Elshamy M., Di Natale G., Pavlidis A., Louërat M.-M., Stratigopoulos H., Hardware Trojan Attacks in Analog/Mixed-Signal ICs via the Test Access Mechanism, IEEE European Test Symposium (ETS 2020), Tallinn, ESTONIA, 2020
 
2 Vatajelu I., Di Natale G., High-Entropy STT-MTJ-based TRNG, 8th Workshop on Trustworthy Manufacturing and Utilization of Secure Devices (TRUDEVICE'2019), Baden Baden, GERMANY, 2019
 
3 Valea E., Flottes M.-L., Di Natale G., Rouzeyre B., Stream Cipher Based Encryption in IEEE Test Standards, 8th Workshop on Trustworthy Manufacturing and Utilization of Secure Devices (TRUDEVICE 2019), Baden Baden, GERMANY, 2019
 
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