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65 résultats

  19 Revues internationales
   2 Conférences invitées
  36 Conférences internationales
   1 Livres & Éditions Ouvrages
   5 Conférences nationales
   2 Thèses

19 Revues internationales

 1 Possamai Bastos R., Dutertre J.M., Garay Trindade M., Andreoni Camponogara Viera R., Potin O., Letiche M., Cheymol B., Beaucour J., Assessment of On-Chip Current Sensor for Detection of Thermal-Neutron Induced Transients, IEEE Transactions on Nuclear Science, Ed. IEEE, Vol. , 2020
 
 2 Aquino Guazzelli R., Garay Trindade M., Acunha Guimaraes L., Ferreira De Paiva Leite T., Fesquet L., Possamai Bastos R., Trojan Detection Test for Clockless Circuits, Journal of Electronic Testing: Theory and Applications, Ed. Springer , Vol. , février 2020
 
 3 Aquino Guazzelli R., Garay Trindade M., Fesquet L., Possamai Bastos R., Learning-Based Reliability Assessment Method for Detection of Permanent Faults in Clockless Circuits, Microelectronics Reliability, Ed. Elsevier, Vol. , septembre 2019
 
 4 Andreoni Camponogara Viera R., Maurine P., Dutertre J.M., Possamai Bastos R., Simulation and Experimental Demonstration of the Importance of IR-Drops During Laser Fault-Injection, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Ed. IEEE, Vol. , juillet 2019
 
 5 Garay Trindade M., Coelho A., Valadares C., Andreoni Camponogara Viera R., Rey S., Cheymol B., Baylac M., Velazco R., Possamai Bastos R., Assessment of a Hardware-Implemented Machine Learning Technique under Neutron Irradiation, IEEE Transactions on Nuclear Science, Ed. IEEE, Vol. , juin 2019
 
 6 Ferreira De Paiva Leite T., Fesquet L., Possamai Bastos R., A body built-in cell for detecting transient faults and dynamically biasing subcircuits of integrated systems, Microelectronics Reliability, Ed. Elsevier, Vol. 88-90, pp. 122-127, septembre 2018
 
 7 Andreoni Camponogara Viera R., Dutertre J.M., Potin O., Flottes M.-L., Di Natale G., Rouzeyre B., Possamai Bastos R., Assessing Body Built-In Current Sensors for Detection of Multiple Transient Faults, Microelectronics Reliability, Ed. Elsevier, Vol. 88-90, pp. 128-134, DOI: 10.1016/j.microrel.2018.07.111, septembre 2018
 
 8 Kerstel E., Gardelein A., Barthelemy M., Gilot Y., Le Coarer E., Rodrigo J., Sequiès T., Borne V., Bourdarot G., Burlet J.-Y., Christidis A., Segura J., Boulanger B., Boutou V., Bouzat M., Chabanol M., Fesquet L., Fourati H., Moulin M., Niot J.-M., Possamai Bastos R., Robu B., Rolland E., Toru S., Fink M., Koduru Joshi S., Ursin R., Nanobob: a CubeSat mission concept for quantum communication experiments in an uplink configuration, EPJ Quantum Technology, Ed. Springer , Vol. 5, No. 6, DOI: 10.1140/epjqt/s40507-018-0070-7, juin 2018
 
 9 Possamai Bastos R., Acunha Guimaraes L., Torres F.S., Fesquet L., Architectures of Bulk Built-In Current Sensors for Detection of Transient Faults in Integrated Circuits, Microelectronics journal, Ed. Elsevier, Vol. , 2017
 
10 Andreoni Camponogara Viera R., Possamai Bastos R., Dutertre J.M., Maurine P., Method for evaluation of transient-fault detection techniques, Microelectronics Reliability, Ed. Elsevier, Vol. , 2017
 
11 Rocha R. O., Torres F.S., Possamai Bastos R., Towards high-sensitive built-in current sensors enabling detection of radiation-induced soft errors, Microelectronics Reliability, Ed. Elsevier, Vol. , 2017
 
12 Rolloff O., Possamai Bastos R., Fesquet L., Exploiting reliable features of asynchronous circuits for designing low-voltage components in FD-SOI technology, Microelectronics Reliability, Ed. Elsevier, Vol. 55, No. 9-10, pp. 1302-1306, DOI: 10.1016/j.microrel.2015.07.028, septembre-octobre 2015
 
13 Dutertre J.M., Possamai Bastos R., Potin O., Flottes M.-L., Rouzeyre B., Di Natale G., Sarafianos A., Improving the ability of Bulk Built-In Current Sensors to detect SEEs by using triple-well CMOS, Microelectronics Reliability, Ed. Elsevier, Vol. 54, No. 9–10, pp. 2289–2294, DOI: 10.1016/j.microrel.2014.07.151, septembre 2014
 
14 Dutertre J.M., Possamai Bastos R., Potin O., Flottes M.-L., Rouzeyre B., Di Natale G., Sensitivity tuning of a bulk built-in current sensor for optimal transient-fault detection, Microelectronics Reliability, Ed. Elsevier, Vol. 53, Issues 9–11, September–November , pp. 1320–1324, DOI: http://dx.doi.org/10.1016/j.microrel.2013.07.069, septembre 2013
 
15 Possamai Bastos R., Di Natale G., Flottes M.-L., Lu F., Rouzeyre B., A New Recovery Scheme Against Short-to-Long Duration Transient Faults in Combinational Logic, Journal of Electronic Testing: Theory and Applications, Ed. Springer , Vol. 29, No. 3, pp. 331-340, DOI: 10.1007/s10836-013-5359-y, juin 2013
 
16 Torres F.S., Possamai Bastos R., Detection of Transient Faults in Nanometer Technologies by using Modular Built-In Current Sensors, Journal of Integrated Circuits and Systems, Vol. 8, No. 2, pp. 89-97, janvier 2013
 
17 Possamai Bastos R., Torres F.S., Di Natale G., Flottes M.-L., Rouzeyre B., Novel transient-fault detection circuit featuring enhanced bulk built-in current sensor with low-power sleep-mode, Microelectronics Reliability, Ed. Elsevier, Vol. 52, No. 9-10, pp. 1781–1786, DOI: 10.1016/j.microrel.2012.06.149, septembre 2012
 
18 Possamai Bastos R., Sicard G., Kastensmidt F., Renaudin M., Reis R., Asynchronous circuits as alternative for mitigation of long-duration transient faults in deep-submicron technologies , Microelectronics Reliability, Ed. Elsevier, Vol. 50, No. 9-11, pp. 1241-1246, DOI: 10.1016/j.microrel.2010.07.014 , janvier 2010
 
19 Possamai Bastos R., Kastensmidt F., Reis R., Design of a soft-error robust microprocessor, Microelectronics journal, Ed. Elsevier, Vol. 40, July, No. 7, pp. 1062-1068, DOI: 10.1016/j.mejo.2008.10.001, juillet 2009
 
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2 Conférences invitées

1 Ferreira De Paiva Leite T., Iga R., Engels S., Possamai Bastos R., Fesquet L., Fine Grain Body-Biasing: A strategy for asynchronous circuits, Invited paper, Application, Design and Technology Conference (ADTC'2018), Grenoble, FRANCE, 12 au 14 juin 2018
 
2 Iga R., Ferreira De Paiva Leite T., Possamai Bastos R., Rolloff O., Diallo M., Fesquet L., Layout Strategies for Body Bias Islands in FD-SOI Systems, Séminaire invité, 20th International IP-SoC Conference and Exhibition (IP-SOC 2017), Grenoble, FRANCE, 6 au 7 décembre 2017
 
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36 Conférences internationales

 1 Fesquet L., Decoudu Y., Iga R., Ferreira De Paiva Leite T., Rolloff O., Diallo M., Possamai Bastos R., Morin-Allory K., Engels S., A Distributed Body-Biasing Strategy for Asynchronous Circuits, 27th IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC 2019), Cuzco, PERU, 6 au 9 octobre 2019
 
 2 Possamai Bastos R., Dutertre J.M., Garay Trindade M., Andreoni Camponogara Viera R., Potin O., Rey S., Cheymol B., Baylac M., Assessment of Current Sensor on Chip for Detecting Neutron-Induced Transients via Body Terminals, Conference on Radiation Effects on Components and Systems (RADECS 2019), Montpellier, FRANCE, 16 au 20 septembre 2019
 
 3 Aquino Guazzelli R., Garay Trindade M., Fesquet L., Possamai Bastos R., Learning-Based Reliability Assessment Method for Detection of Permanent Faults in Clockless Circuits, 30th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2019), Toulouse, FRANCE, 23 au 26 août 2019
 
 4 Ferreira De Paiva Leite T., Fesquet L., Possamai Bastos R., A body built-in cell for detecting transient faults and dynamically biasing subcircuits of integrated systems, European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF'2018), Aalborg, DENMARK, 1 au 5 octobre 2018
 
 5 Andreoni Camponogara Viera R., Dutertre J.M., Potin O., Flottes M.-L., Di Natale G., Rouzeyre B., Possamai Bastos R., Assessing Body Built-In Current Sensors for Detection of Multiple Transient Faults, European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF'2018), Aalborg, DENMARK, 1 au 5 octobre 2018
 
 6 Garay Trindade M., Coelho A., Valadares C., Andreoni Camponogara Viera R., Rey S., Cheymol B., Baylac M., Velazco R., Possamai Bastos R., Assessment of Hardware-Implemented Support Vector Machine under Radiation Effects, Conference on Radiation Effects on Components and Systems (RADECS'2018), Gothenburg, SWEDEN, 16 au 21 septembre 2018
 
 7 Iga R., Possamai Bastos R., Ferreira De Paiva Leite T., Rolloff O., Mamadou D., Fesquet L., Level Shifter Architecture for Dynamically Biasing Ultra-Low Voltage Subcircuits of Integrated Systems, IEEE International Symposium on Circuits and Systems (ISCAS'2018), Florence, ITALY, 27 au 30 mai 2018
 
 8 Andreoni Camponogara Viera R., Dutertre J.M., Maurine P., Possamai Bastos R., Standard CAD tool-based method for simulation of laser-induced faults in large-scale circuits, ACM International Symposium on Physical Design (ISPD'2018), Monterey, UNITED STATES, 25 au 28 mars 2018
 
 9 Possamai Bastos R., Ferreira De Paiva Leite T., Fesquet L., Acunha Guimaraes L., Non-Intrusive Testing Technique for Detection of Trojans in Asynchronous Circuits, Design, Automation and Test in Europe (DATE'2018), Dresden, GERMANY, 19 au 23 mars 2018
 
10 Andreoni Camponogara Viera R., Possamai Bastos R., Dutertre J.M., Maurine P., Method for evaluation of transient-fault detection techniques, European Symposium on Reliability of Electron devices, Failure physics and analysis (ESREF 2017), Bordeaux, FRANCE, 25 au 28 septembre 2017
 
11 Andreoni Camponogara Viera R., Dutertre J.M., Possamai Bastos R., Maurine P., Role of Laser-Induced IR Drops in the Occurrence of Faults: Assessment and Simulation, EUROMICRO conference on Digital System Design (DSD 2017), Vienna, AUSTRIA, 30 août au 1 septembre 2017
 
12 Acunha Guimaraes L., Possamai Bastos R., Fesquet L., Detection of Layout-Level Trojans by Monitoring Substrate with Preexisting Built-in Sensors, IEEE Computer Society Annual Symposium on VLSI (ISVLSI 2017), pp. 290-295, Bochum, GERMANY, DOI: 10.1109/ISVLSI.2017.58, 3 au 5 juillet 2017
 
13 Acunha Guimaraes L., Possamai Bastos R., Fesquet L., Detection of Layout-Level Trojans by Injecting Current Into Substrate and Digitally Monitoring Built-In Sensors, Design Automation Conference (DAC 2017), Austin, TX, UNITED STATES, 18 au 22 juin 2017
 
14 Andreoni Camponogara Viera R., Maurine P., Dutertre J.M., Possamai Bastos R., Importance of IR Drops on the Modeling of Laser-Induced Transient Faults, International Conference on Synthesis, Modeling, Analysis and simulation methods and applications to Circuit Design (SMACD 2017), Giardini Naxos - Taormina, ITALY, 12 au 15 juin 2017
 
15 Simatic J., Cherkaoui A., Bertrand Fra., Possamai Bastos R., Fesquet L., A practical framework for specification, verification and design of self-timed pipelines, 23rd IEEE International Symposium on Asynchronous Circuits and Systems (ASYNC 2017), San Diego, Ca, UNITED STATES, 21 au 24 mai 2017
 
16 Ferreira De Paiva Leite T., Possamai Bastos R., Iga R., Fesquet L., Comparison of Low-Voltage Scaling in Synchronous and Asynchronous FD-SOI Circuits, 26th International Workshop on Power and Timing Modeling, Optimization and Simulation (PATMOS'16), Bremen, GERMANY, 21 au 23 septembre 2016
 
17 Simatic J., Cherkaoui A., Possamai Bastos R., Fesquet L., New asynchronous protocols for enhancing area and throughput in bundle-data pipelines, 29th Symposium on Integrated Circuits and Systems Design (SBCCI'16), Belo Horizonte, BRAZIL, 29 août au 3 septembre 2016
 
18 Simatic J., Possamai Bastos R., Fesquet L., High-Level Synthesis for Event-based Systems, 2nd International Conference on Event-Based Control, Communication and Signal Processing (EBCCSP'16), Krakow, POLAND, 13 au 15 juin 2016
 
19 Acunha Guimaraes L., Possamai Bastos R., Ferreira De Paiva Leite T., Fesquet L., Simple Tri-State Logic Trojans Able to Upset Properties of Ring Oscillators, 11th International Conference on Design &Technology of Integrated Systems in Nanoscale Era (DTIS'16), pp. 1-6, Istanbul, TURKEY, DOI: 10.1109/DTIS.2016.7483811, 12 au 14 avril 2016
 
20 Simatic J., Possamai Bastos R., Fesquet L., AHLS_DESYNC: A Desynchronization Tool For High-Level Synthesis of Asynchronous Circuits, Design, Automation and Test in Europe (DATE'16) - University Booth, Dresden, GERMANY, 14 au 18 mars 2016
 
21 Andreoni Camponogara Viera R., Possamai Bastos R., Dutertre J.M., Potin O., Flottes M.-L., Di Natale G., Rouzeyre B., Validation of Single BBICS Architecture in Detecting Multiple Faults, IEEE Asian Test Symposium (ATS'15), Bombay, INDIA, 23 au 25 novembre 2015
 
22 Rolloff O., Possamai Bastos R., Fesquet L., Exploiting reliable features of asynchronous circuits for designing low-voltage components in FD-SOI technology, 26th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF'15), Toulouse, FRANCE, 5 au 9 octobre 2015
 
23 Melo J.G.M., Torres F.S., Possamai Bastos R., Exploration of Noise Robustness and Sensitivity of Bulk Current Sensors for Soft Error Detection, International Workshop on CMOS Variability (VARI'15), pp. 13-18, Salvador Bahia, BRAZIL, DOI: 10.1109/VARI.2015.7456556, 1 au 4 septembre 2015
 
24 Possamai Bastos R., Dutertre J.M., Torres F.S., Comparison of Bulk Built-In Current Sensors in terms of Transient-Fault Detection Sensitivity, European Workshop on CMOS Variability (VARI'14), pp. 1-6, Palma de Mallorca, SPAIN, DOI: 10.1109/VARI.2014.6957089, 29 septembre au 1 octobre 2014
 
25 Dutertre J.M., Possamai Bastos R., Potin O., Flottes M.-L., Rouzeyre B., Di Natale G., Design of Bulk Built-In Current Sensors to Detect Single Event Effects and Laser-Induced Fault Injection Attempts, Workshop on Trustworthy Manufacturing and Utilization of Secure Devices (TRUDEVICE'14), Paderborn, GERMANY, 29 au 30 mai 2014
 
26 Dutertre J.M., Possamai Bastos R., Potin O., Flottes M.-L., Rouzeyre B., Di Natale G., Sensitivity tuning of a bulk built-in current sensor for optimal transient-fault detection, European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF'13), Arcachon, FRANCE, 30 septembre au 4 octobre 2013
 
27 Possamai Bastos R., Torres F.S., Dutertre J.M., Flottes M.-L., Di Natale G., Rouzeyre B., A Single Built-in Sensor to Check Pull-up and Pull-down CMOS Networks against Transient Faults, International Workshop on Power and Timing Modeling, Optimization and Simulation (PATMOS'13), Karlsruhe, GERMANY, 9 au 11 septembre 2013
 
28 Possamai Bastos R., Torres F.S., Dutertre J.M., Flottes M.-L., Di Natale G., Rouzeyre B., A Bulk Built-in Sensor for Detection of Fault Attacks, International Symposium on Hardware Oriented Security and Trust (HOST'13), pp. 51-54, Austin, TX, UNITED STATES, DOI: 10.1109/HST.2013.6581565, 2 au 3 juin 2013
 
29 Possamai Bastos R., Torres F.S., Di Natale G., Flottes M.-L., Rouzeyre B., Novel transient-fault detection circuit featuring enhanced bulk built-in current sensor with low-power sleep-mode, 23rd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF'12), Cagliari, ITALY, 1 au 5 octobre 2012
 
30 Torres F.S., Possamai Bastos R., Robust modular Bulk Built-in Current Sensors for detection of transient faults, 25th Symposium on Integrated Circuits and Systems Design (SBCCI'12), pp. 1-6, Brasilia, BRAZIL, DOI: 10.1109/SBCCI.2012.6344422, 30 août au 2 septembre 2012
 
31 Possamai Bastos R., Di Natale G., Flottes M.-L., Rouzeyre B., How to Sample Results of Concurrent Error Detection Schemes in Transient Fault Scenarios?, 12th European Conference on Radiation and Its Effects on Components and Systems (RADECS'11), pp. 635-642, Sevilla, SPAIN, DOI: 10.1109/RADECS.2011.6131361, 22 au 23 septembre 2011
 
32 Possamai Bastos R., Sicard G., Kastensmidt F., Renaudin M., Reis R., Asynchronous circuits as alternative for mitigation of long-duration transient faults in deep-submicron technologies , 21st European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF), pp. 4, Monte Cassino Abbey and Gaeta, ITALY, 11 au 15 octobre 2010
 
33 Possamai Bastos R., Sicard G., Kastensmidt F., Renaudin M., Reis R., Evaluating transient-fault effects on traditional C-element's implementations, 16th IEEE International On-Line Testing Symposium (IOLTS’10), pp. 35 - 40 , Corfu Island, GREECE, DOI: 10.1109/IOLTS.2010.5560237 , 5 au 7 juillet 2010
 
34 Possamai Bastos R., Sicard G., Kastensmidt F., Renaudin M., Reis R., Asynchronous circuits as alternative for mitigation of long-duration transient faults in deep-submicron technologies , 15th IEEE European Test Symposium (ETS’10), Prague, CZECH REPUBLIC, 24 au 28 mai 2010
 
35 Possamai Bastos R., Monnet Y., Sicard G., Kastensmidt F., Renaudin M., Reis R., Comparing Transient-Fault Effects on Synchronous and on Asynchronous Circuits, 15th IEEE International On-Line Testing Symposium (IOLTS'09), pp. 29-34, Sesimbra-Lisbon, PORTUGAL, DOI: 10.1109/IOLTS.2009.5195979, 24 au 27 juin 2009
 
36 Possamai Bastos R., Monnet Y., Sicard G., Kastensmidt F., Renaudin M., Reis R., A Methodology to Evaluate Transient-Fault Effects on Asynchronous and Synchronous Circuits, 14th IEEE European Test Symposium (ETS'09), Sevilla, SPAIN, 25 mai 2009
 
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1 Livres & Éditions Ouvrages

1 Possamai Bastos R., Torres F.S. (Eds.) On-Chip Current Sensors for Reliable, Secure, and Low-Power Integrated Circuits, pp. 1-162, Ed. Springer , 2019
 
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5 Conférences nationales

1 Rolloff O., Iga R., Ferreira De Paiva Leite T., Possamai Bastos R., Fesquet L., Body Bias Control Cells based on Negative- and Positive-Level Shifter Architectures in Technology FD-SOI 28 nm, Journées Nationales du Réseau Doctoral en Micro-nanoélectronique (JNRDM 2017), Strasbourg, FRANCE, 6 au 8 novembre 2017
 
2 Rolloff O., Ferreira De Paiva Leite T., Possamai Bastos R., Fesquet L., Analysis of granularity for automatic biasing control in FDSOI technology with low-voltage supply, Journées Nationales du Réseau Doctoral en Micro-Nanoélectronique (JNRDM'16), Toulouse, FRANCE, 11 au 13 mai 2016
 
3 Ferreira De Paiva Leite T., Possamai Bastos R., Fesquet L., QDI asynchronous circuits for low power applications: a comparative study in technology FD-SOI 28 nm, Journées Nationales du Réseau Doctoral en Micro-Nanoélectronique (JNRDM'16), Toulouse, FRANCE, 11 au 13 mai 2016
 
4 Acunha Guimaraes L., Possamai Bastos R., Fesquet L., A New Proposition on Hardware Trojan Activation, Journées Nationales du Réseau Doctoral en Micro-nanoélectronique (JNRDM'15), Bordeaux, FRANCE, 5 au 7 mai 2015
 
5 Simatic J., Possamai Bastos R., Fesquet L., Flot de conception pour l'ultra-faible consommation : échantillonage non-uniforme et électronique asynchrone, Journées Nationales du Réseau Doctoral en Micro-nanoélectronique (JNRDM'15), Bordeaux, FRANCE, 5 au 7 mai 2015
 
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2 Thèses

1 Possamai Bastos R., Exploiting Body Terminals of Transistors for Performing Post-Fabrication Tests, Run-Time Tests, and Self-Adaptive Bias in Integrated Circuits, HDR, 30 janvier 2018
 
2 Possamai Bastos R., Transient-Fault Robust Systems Exploiting Quasi-Delay Insensitive Asynchronous Circuits, These de Doctorat, 9 juillet 2010
 
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