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84 résultats

  28 Revues internationales
   4 Conférences invitées
  34 Conférences internationales
   3 Chapitres de livre
   4 Livres & Éditions Ouvrages
   6 Autres communications
   1 Rapports
   4 Thèses

28 Revues internationales

 1 Garay Trindade M., Coelho A., Valadares C., Andreoni Camponogara Viera R., Rey S., Cheymol B., Baylac M., Velazco R., Possamai Bastos R., Assessment of a Hardware-Implemented Machine Learning Technique under Neutron Irradiation, IEEE Transactions on Nuclear Science, Ed. IEEE, Vol. , juin 2019
 
 2 Franco F., Clemente J.A., Mecha H., Velazco R., Influence of Randomness during the Interpretation of Results from Single-Event Experiments on SRAMs (Early Access), IEEE Transactions on Device and Materials Reliability, Vol. , DOI: 10.1109/TDMR.2018.2886358, 2018
 
 3 Kchaou A., El Hadj Youssef W., Velazco R., Tourki R., An exhaustive analysis of SEU effects in the SRAM memory of soft processor, International Journal of Engineering Science and Technology, Vol. 13, No. 1, 2018
 
 4 Papavramidou P., Nicolaidis M., Iterative Diagnosis Approach for ECC-based Memory Repair, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Ed. IEEE, Vol. , DOI: 10.1109/TCAD.2018.2887052, décembre 2018
 
 5 Papavramidou P., Nicolaidis M., Iterative Diagnosis Approach for ECC-based Memory Repair (Early Access), IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Ed. IEEE, Vol. , DOI: 10.1109/TCAD.2018.2887052, décembre 2018
 
 6 Vargas V., Ramos P., Velazco R., Evaluation by Neutron Radiation of the NMR-MPar Fault-Tolerance Approach Applied to Applications Running on a 28-nm Many-Core Processor, Electronics Letters, Ed. IEEE, Vol. 7, No. 11, DOI: 10.3390/electronics7110312, novembre 2018
 
 7 Charif A., Coelho A., Ebrahimi M., Bagherzadeh N., Zergainoh N.-E., First-Last: A Cost-Effective Adaptive Routing Solution for TSV-Based Three-Dimensional Networks-on-Chip, IEEE Transactions on Computers, Ed. IEEE, Vol. 67, No. 10, pp. 1430-1444, DOI: 10.1109/TC.2018.2822269, octobre 2018
 
 8 Nicolaidis M., Dimopoulos M., The Quest of the Ideal Error Detecting Architecture: The GRAAL Architecture (Early Access), IEEE Transactions on Sustainable Computing, Ed. IEEE, Vol. , DOI: 10.1109/TSUSC.2018.2878832, octobre 2018
 
 9 Vargas V., Ramos P., Méhaut J-F., Velazco R., NMR-Mpar: A Fault-Tolerance Approach for Multi-Core and Many-Core Processors, Applied Sciences, Ed. MDPI, Vol. , DOI: 10.3990/app8030465, août 2018
 
10 Bonnoit T., Zergainoh N.-E., Nicolaidis M., Reducing Rollback Cost in VLSI Circuits to Improve Fault Tolerance, Transactions on Very Large Scale Integration (VLSI) Systems, Ed. IEEE, Vol. 26, No. 8, pp. 1438-1451, DOI: 10.1109/TVLSI.2018.2818021, août 2018
 
11 Ramos P., Vargas V., Baylac M., Zergainoh N.-E., Velazco R., SEE error-rate evaluation of an application implemented in COTS Multi/Many-core processors, IEEE Transactions on Nuclear Science, Ed. IEEE, Vol. 65, No. 8, pp. 1879-1886, DOI: 10.1109/TNS.2018.2838526, août 2018
 
12 Ramos P., Vargas V., Zergainoh N.-E., Velazco R., Assessing the Static and Dynamic Sensitivity of a Commercial Off-the-Shelf Multicore Processor for Noncritical Avionic Applications, Journal of Nanotechnology, Ed. Hindawi Publishing Corporation, Vol. 2018, No. ID 2926392, pp. 1-8, DOI: 10.1155/2018/2926392, juillet 2018
 
13 Franco F., Clemente J.A., Baylac M., Rey S., Villa F., Mecha H., Agapito J.-A., Puchner H., Hubert G., Velazco R., Statistical Deviations from the Theoretical only-SBU Model to Estimate MCU rates in SRAMs, IEEE Transactions on Nuclear Science, Ed. IEEE, Vol. 64, pp. 2152–2160, 2017
 
14 Charif A., Coelho A., Zergainoh N.-E., Nicolaidis M., A Framework for Scalable TSV Assignment and Selection in Three-Dimensional Networks-on-Chip, Journal of VLSI Design, Ed. Hindawi Publishing Corporation, Vol. , DOI: 10.1155/2017/9427678, 2017
 
15 Charif A., Coelho A., Zergainoh N.-E., Nicolaidis M., A Dynamic Sufficient Condition of Deadlock-Freedom for High-Performance Fault-Tolerant Routing in Networks-on-Chips, IEEE Transactions on Emerging Topics in Computing, Ed. IEEE, Vol. PP, No. 99, DOI: 10.1109/TETC.2017.2776909, novembre 2017
 
16 Clemente J.A., Franco F., Villa F., Baylac M., Rey S., Mecha H., Puchner H., Agapito J.-A., Hubert G., Velazco R., SEU Characterization of Three Successive Generations of COTS SRAMs at Ultralow Bias Voltage to 14.2 MeV Neutrons, IEEE Transactions on Nuclear Science, Ed. IEEE, Vol. 64, No. 8, pp. 2152-2160, DOI: 10.1109/TNS.2017.2726938, août 2017
 
17 Fraire J., Madoery P., Burleigh S., Charif A., Zergainoh N.-E., Velazco R., Assessing Contact Graph Routing Performance and Reliability in Distributed Satellite Constellations, Journal of Computer Networks and Communications, Ed. Hindawi Publishing Corporation, Vol. 2017, pp. 1-18, DOI: 10.1155/2017/2830542, juillet 2017
 
18 Clemente J.A., Hubert G., Franco F., Villa F., Baylac M., Mecha H., Puchner H., Velazco R., Sensitivity Characterization of a COTS 90-nm SRAM at Ultra Low Bias Voltage, IEEE Transactions on Nuclear Science, Ed. IEEE, Vol. PP, No. 99, DOI: 10.1109/TNS.2017.2682984, mars 2017
 
19 Coelho A., Laurent R., Solinas M., Fraire J., Mazer E., Zergainoh N.-E., Velazco R., On the Robustness of Stochastic Bayesian Machines, IEEE Transactions on Nuclear Science, Ed. IEEE, Vol. PP, No. 99, DOI: 10.1109/TNS.2017.2678204, mars 2017
 
20 Vargas V., Ramos P., Ray V., Jalier C., Stevens R., Dupont De Dinechin B., Baylac M., Villa F., Rey S., Zergainoh N.-E., Méhaut J-F., Velazco R., Radiation Experiments on a 28nm Single-Chip Many-core Processor and SEU error-rate prediction, IEEE Transactions on Nuclear Science, Ed. IEEE, Vol. 64, No. 1, pp. 483-490, DOI: 10.1109/TNS.2016.2638081, janvier 2017
 
21 Souari A., Thibeault Cl., Blaquière Y., Velazco R., Towards an efficient SEU effects emulation on SRAM-based FPGAs, Microelectronics Reliability, Ed. Elsevier, Vol. 66, pp. 173-182, novembre 2016
 
22 Papavramidou P., Nicolaidis M., Test Algorithms for ECC-based Memory Repair in Ultimate CMOS and Post-CMOS, IEEE Transactions on Computers, Ed. IEEE, Vol. 65, No. 7, pp. 2284-2298, DOI: 10.1109/TC.2015.2479618, septembre 2016
 
23 Clemente J.A., Franco F., Villa F., Baylac M., Ramos P., Vargas V., Mecha H., Agapito J.-A., Velazco R., Neutron-Induced Single Events in a COTS Soft-Error Free SRAM at Low Bias Voltage Neutrons, IEEE Transactions on Nuclear Science, Ed. IEEE, Vol. 63, No. 4, pp. 2072-2079, août 2016
 
24 Ramos P., Vargas V., Clemente J.A., Zergainoh N.-E., Méhaut J-F., Velazco R., Evaluating the SEE Sensitivity of a 45 nm SOI Multi-Core Processor Due to 14 MeV Neutrons, IEEE Transactions on Nuclear Science, Ed. IEEE, Vol. 63, No. 4, pp. 2193 - 2200, DOI: 10.1109/TNS.2016.2537643, juillet 2016
 
25 Clemente J.A., Franco F., Villa F., Baylac M., Rey S., Mecha H., Agapito J.-A., Puchner H., Hubert G., Velazco R., Statistical Anomalies of Bitflips in SRAMs to Discriminate SBUs from MCUs, IEEE Transactions on Nuclear Science, Ed. IEEE, Vol. 63, No. 4, pp. 2087–2094, DOI: 10.1109/TNS.2016.2551263, avril 2016
 
26 Clemente J.A., Franco F., Villa F., Baylac M., Ramos P., Vargas V., Mecha H., Agapito J.-A., Velazco R., Single Events in a COTS Soft-Error Free SRAM at Low Bias Voltage Induced by 15-MeV Neutrons, IEEE Transactions on Nuclear Science, Ed. IEEE, Vol. 63, No. 4, pp. 2072 - 2079, DOI: 10.1109/TNS.2016.2522819, avril 2016
 
27 Clemente J.A., Mansour W., Ayoubi R., Serrano F., Mecha H., Ziade H., El Falou W., Velazco R., Hardware implementation of a fault-tolerant Hopfield Neural Network on FPGAs, Neurocomputing Journal, Ed. Elsevier, Vol. 171, No. 1, pp. 1606-1609, DOI: 10.1016/j.neucom.2015.06.038, janvier 2016
 
28 Nicolaidis M., Double-Sampling Design Paradigm - a Compendium of Architectures, IEEE Transactions on Device and Materials Reliability, Vol. 15, No. 1, pp. 10-23, DOI: 10.1109/TDMR.2014.2388358, mars 2015
 
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4 Conférences invitées

1 Harutyunyan G., Nofal I., Nicolaidis M., Zorian Y., FIT Rate Calculation and Mitigation Techniques for Advanced Technologies and Automotive Applications, Invited Talk, 3rd IEEE International Workshop on Automotive Reliability & Test (ART'2018), Phoenix (AZ), UNITED STATES, 1 au 2 novembre 2018
 
2 Velazco R., Error-rate prediction for programmable circuits: methodology, tools and studied cases, Invited Talk, 2nd Aerospace Bolivian Conference (ABC’16), La Paz, BOLIVIA, 27 au 29 juillet 2016
 
3 Velazco R., Error rate prediction for programmable circuits: methodology, tools and studied cases, Workshop on the Effects of Ionizing Radiation on Electronic and Photonic Components for Aerospacial applications (WERICE'15), São José dos Campos, BRAZIL, 3 au 5 novembre 2015
 
4 Velazco R., Effects of radiation in digital integrated circuits: origins, mitigation technics and experimental tests, IEEE WESCIS (Education Society and Computer Intelligence Society), Tucuman, ARGENTINA, 2 octobre 2015
 
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34 Conférences internationales

 1 Coelho A., Charif A., Zergainoh N.-E., Velazco R., A Runtime Fault-Tolerant Routing Scheme for Partially Connected 3D Networks-on-Chip, IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2018), pp. 1-6, Chicago, UNITED STATES, 8 au 10 octobre 2018
 
 2 Garay Trindade M., Coelho A., Valadares C., Andreoni Camponogara Viera R., Rey S., Cheymol B., Baylac M., Velazco R., Possamai Bastos R., Assessment of Hardware-Implemented Support Vector Machine under Radiation Effects, Conference on Radiation Effects on Components and Systems (RADECS'2018), Gothenburg, SWEDEN, 16 au 21 septembre 2018
 
 3 Coelho A., Charif A., Zergainoh N.-E., Fraire J., Velazco R., A soft-error resilient route computation unit for 3D Networks-on-Chips, Design, Automation & Test in Europe (DATE'2018), Dresden, GERMANY, 19 au 23 mars 2018
 
 4 Bonnoit T., Bouesse G.F., Zergainoh N.-E., Nicolaidis M., Designing reliable processor cores in ultimate CMOS and beyond: A double sampling solution, Design, Automation & Test in Europe (DATE'2018), Dresden, GERMANY, 19 au 23 mars 2018
 
 5 Fraire J., Madoery P., Raverta F., Finochietto J., Velazco R., DtnSim: Bridging the Gap Between Simulation and Implementation of Space-Terrestrial DTNs, 6th Conference on Space Mission Challanges for Information Technologies (SMC-IT 2017), Alcalá de Henares, SPAIN, 27 septembre 2017
 
 6 Charif A., Zergainoh N.-E., Coelho A., Nicolaidis M., Rout3D: A Lightweight Adaptive Routing Algorithm for Tolerating Faulty Vertical Links in 3D-NoCs, 22th IEEE European Test Symposium (ETS 2017), pp. 1-6, Limassol, CYPRUS, 22 au 26 mai 2017
 
 7 Fraire J., Feldmann M., Burleigh S., Benefits and Challenges of Cross-Linked Ring Road Satellite Networks: A Case Study, IEEE International Conference on Communications (ICC 2017), Paris, FRANCE, 1 mai 2017
 
 8 Solinas M., Coelho A., Fraire J., Zergainoh N.-E., Velazco R., TGV: Tester Generic and Versatile for Radiation Effects on Advanced VLSI Circuits, IEEE/ACM Design, Automation, and Test in Europe (DATE 2017), Univ. Booth, Lausanne, SWITZERLAND, 27 au 31 mars 2017
 
 9 Charif A., Zergainoh N.-E., Nicolaidis M., GNOCS: an ultra-fast, highly extensible, cycle-accurate GPU-Based parallel Network-on-Chip simulator, Design, Automation & Test in Europe Conference, Univ.Booth (DATE 2017), Lausanne, SWITZERLAND, 23 au 31 mars 2017
 
10 Charif A., Coelho A., Zergainoh N.-E., Nicolaidis M., MINI-ESPADA: A Low-Cost Fully Adaptive Routing Mechanism for Networks-on-Chips, IEEE Latin-American Test Symposium (LATS 2017), pp. 1-4, Bogota, COLOMBIA, 13 au 15 mars 2017
 
11 Bonnoit T., Coelho A., Zergainoh N.-E., Velazco R., SEU Impact in Processor's Control-Unit: Preliminary Results Obtained for LEON3 Soft-Core, 18th IEEE Latin American Test Symposium (LATS 2017), pp. 1-4, Bogota, COLOMBIA, 13 au 15 mars 2017
 
12 Barrientos J., Ferral A., Cara L., Fraire J., Velazco R., Madoery P., Ferreyra P., A Segmented Architecture Approach to Provide a Continuous, Long-Term, Adaptive and Cost-effective Glaciers Monitoring System Based on DTN Communications and Cubesat Platforms, 1st IAA Latin American Symposium on Small Satellites: Advanced Technologies and Distributed Systems, Buenos Aires, ARGENTINA, 7 au 10 mars 2017
 
13 Ferreyra P., Fraire J., Gomez F., Barrientos J., Velazco R., Enhancing Contact Graph Routing Forwarding Performance for Segmented Satellites Architectures, 1st IAA Latin American Symposium on Small Satellites: Advanced Technologies and Distributed Systems, San Martin Buenos Aires, ARGENTINA, 7 au 10 mars 2017
 
14 Solinas M., Coelho A., Fraire J., Zergainoh N.-E., Ferreyra P., Velazco R., Preliminary Results of NETFI-2: An Automatic Method for Fault Injection on HDL-Based Designs, 18th IEEE Latin-American Test Symposium (LATS 2017), Bogota, COLOMBIA, 1 mars 2017
 
15 Bonnoit T., Zergainoh N.-E., Nicolaidis M., Velazco R., Low Cost Rollback to Improve Fault-Tolerance in VLSI Circuits, IEEE International Symposium on Circuits and Systems (LASCAS 2017), pp. 1-4, Bariloche, ARGENTINA, 20 au 23 février 2017
 
16 Charif A., Coelho A., Zergainoh N.-E., Nicolaidis M., Detailed and highly parallelizable cycle-accurate network-on-chip simulation on GPGPU, ACM/IEEE Design Automation Conference (ASPDAC 2017), pp. 672-677, Chiba/Tokyo, JAPAN, DOI: 10.1109/ASPDAC.2017.7858401, 16 au 19 janvier 2017
 
17 Papavramidou P., Memory repair for high fault rates, IEEE International Test Conference (ITC'2016), Fort Worth, UNITED STATES, DOI: 10.1109/TEST.2016.7805874, 15 au 17 novembre 2016
 
18 Solinas M., Fraire J., Coderch N., Ferrer A., Velazco R., Primeros Resultados con NETFI-2: Una Nueva Herramienta para la Inyección de Fallos en Diseños Basados en HDL, VII Congreso de Microelectrónica Aplicada, San Luis, ARGENTINA, 26 au 28 octobre 2016
 
19 Charif A., Zergainoh N.-E., Nicolaidis M., A New Approach to Deadlock-Free Fully Adaptive Routing for High-Performance Fault-Tolerant NoCs, IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT'16), Connecticut, UNITED STATES, 19 au 21 septembre 2016
 
20 Clemente J.A., Hubert G., Franco F., Villa F., Baylac M., Mecha H., Velazco R., Evaluation of the Sensitive of a COTS 90-nm Memory at Low Bias Voltage, Radiation and its Effects on Components and Systems (RADECS'16)), Bremen, GERMANY, 19 au 23 septembre 2016
 
21 Coelho A., Solinas M., Laurent R., Fraire J., Mazer E., Zergainoh N.-E., Karaoui S., Velazco R., Evidences of Stochastic Bayesian Machines Robustness Against SEUs and SETs, IEEE European Conference on Radiation and its Effects on Components and Systems (RADECS'16), Bremen, GERMANY, 19 au 23 septembre 2016
 
22 Franco F., Clemente J.A., Baylac M., Rey S., Villa F., Mecha H., Agapito J.-A., Puchner H., Hubert G., Velazco R., Some Properties of only-SBUs Scenarios in SRAMs Applied to the Detection of MCUs, Radiation and its Effects on Components and Systems (RADECS'16), Bremen, GERMANY, 19 au 23 septembre 2016
 
23 Fraire J., Madoery P., Finochietto J., Ferreyra R., Velazco R., Internetworking Approaches Towards Along-Track Segmented Satellite Architectures, IEEE International Conference on Wireless for Space and Extreme Environments (WiSEE'16), Aachen, GERMANY, 1 au 9 septembre 2016
 
24 Nicolaidis M., Dimopoulos M., Advanced Double-Sampling Architectures, 22nd IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS'2016), Sant Feliu de Guixols, SPAIN, DOI: 10.1109/IOLTS.2016.7604685, 4 au 6 juillet 2016
 
25 Charif A., Zergainoh N.-E., Nicolaidis M., Addressing transient routing errors in fault-tolerant Networks-on-Chips, 21th IEEE European Test Symposium (ETS'06)), Amsterdam, NETHERLANDS, 23 au 27 mai 2016
 
26 Souari A., Thibeault Cl., Blaquière Y., Velazco R., An Automated Fault Injection for Evaluation of LUTs Robustness in SRAM-Based FPGAs, IEEE East-West Design & Test Symposium (EWDTS’15), Batumi, GEORGIA, 26 au 29 septembre 2015
 
27 Clemente J.A., Franco F., Villa F., Baylac M., Ramos P., Vargas V., Mecha H., Agapito J.-A., Velazco R., Neutron-Induced Single Events in a COTS Soft-Error Free SRAM at Low Bias Voltage, Radiation and its Effects on Components and Systems (RADECS’15), pp. 1-4, Moscow, RUSSIAN FED, DOI: 10.1109/RADECS.2015.7365640 , 14 au 18 septembre 2015
 
28 Ramos P., Vargas V., Baylac M., Villa F., Rey S., Clemente J.A., Zergainoh N.-E., Velazco R., Sensitivity to Neutron Radiation of a 45 nm SOI Multi-Core Processor, Radiation and Its Effects on Components and Systems (RADECS’15), Moscow, RUSSIAN FED, DOI: 10.1109/RADECS.2015.7365665 , 14 au 18 septembre 2015
 
29 Clemente J.A., Franco F., Villa F., Baylac M., Rey S., Mecha H., Agapito J.-A., Puchner H., Hubert G., Velazco R., Statistical Anomalies of Bitflips in SRAMs to Discriminate MCUs from SEUs, Radiation and its Effects on Components and Systems (RADECS’15), pp. 1-4, Moscow, RUSSIAN FED, DOI: 10.1109/RADECS.2015.7365670, 14 au 18 septembre 2015
 
30 Papavramidou P., Nicolaidis M., Low-power memory repair for high defect densities, 21st IEEE International On-Line Testing Symposium (IOLTS'15), pp. 171-173, Halkidiki, GREECE, DOI: 10.1109/IOLTS.2015.7229853, 6 au 8 juillet 2015
 
31 Charif A., Zergainoh N.-E., Nicolaidis M., MUGEN: A High-Performance Fault-Tolerant Routing Algorithm for Unreliable Networks-on- Chip, 21st IEEE International On-Line Testing Symposium (IOLTS'15), pp. 71-76, Halkidiki, GREECE, DOI: 10.1109/IOLTS.2015.7229835, 6 au 8 juillet 2015
 
32 Souari A., Thibeault Cl., Blaquière Y., Velazco R., Optimization of SEU emulation on SRAM FPGAs based on sensitiveness analysis, 21st International On-Line Testing Symposium (IOLTS'15), pp. 36-39, Halkidiki, GREECE, DOI: 10.1109/IOLTS.2015.7229827, 6 au 8 juillet 2015
 
33 Nicolaidis M., Papavramidou P., Memory repair for high defect densities, 33rd IEEE VLSI Test Symposium (VTS'15), pp. 1-4, Napa Valley, California, UNITED STATES, DOI: 10.1109/VTS.2015.7116277, 27 au 29 avril 2015
 
34 Vargas V., Ramos P., Velazco R., Méhaut J-F., Zergainoh N.-E., Evaluating SEU fault-injection on parallel applications implemented on multicore processors, IEEE 6th Latin American Symposium on Circuits & Systems (LASCAS'15), pp. 1-4, Montevideo, URUGUAY, DOI: 10.1109/LASCAS.2015.7250449, 25 au 27 février 2015
 
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3 Chapitres de livre

1 Ramos P., Vargas V., Velazco R., Zergainoh N.-E., Error Rate Prediction of Applications Implemented in Multi-Core and Many-Core Processors, Radiation Effects on Integrated Circuits and Systems for Space Applications, Velazco R., McMorrow D., Estela J. (Eds.) , Ed. Springer , pp. 145-173, Vol. 2, 2019
 
2 Vargas V., Ramos P., Méhaut J-F., Velazco R., Improving Reliability of Multi-/Many-Core Processors by Using NMR-MPar Approach, Radiation Effects on Integrated Circuits and Systems for Space Applications, Velazco R., McMorrow D., Estela J. (Eds.) , Ed. Springer , pp. 175-203, DOI: 10.1007/978-3-030-04660-6_8, 2019
 
3 Souari A., Thibeault Cl., Blaquière Y., Velazco R., Towards an efficient SEU effects emulation on SRAM-based FPGAs, Microelectronics Reliability, Professor N. D. S TOJADINOVIC (Eds.) , Ed. Elsevier, pp. 173-182, Vol. 66, 2016
 
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4 Livres & Éditions Ouvrages

1 Velazco R., Mcmorrow D., Estela J. (Eds.) Radiation Effects on Integrated Circuits and Systems for Space Applications, pp. 401 pages, Ed. Springer , 2019
 
2 Gizopoulos D., Alexandrescu D., Nicolaidis M. (Eds.) Guest Editorial: Robust System Design - IEEE International On-Line Testing and Robust System Design Symposium (IOLTS) 2018, IEEE Transactions on Device and Materials Reliability, Vol. 19 - Issue 1, pp. 3-5, Ed. IEEE, 2019
 
3 Gizopoulos D., Alexandrescu D., Nicolaidis M. (Eds.) Foreword to the Special Section on the IEEE International On-Line Testing and Robust System Design Symposium (IOLTS) 2016 (in IEEE Transactions on Device and Materials Reliability), Vol. 17, n° 1, pp. 1-2, Ed. IEEE, 2017
 
4 Nicolaidis M. (Eds.) Design for Reliability and Yield for Ultimate CMOS Technologies, IEEE Transactions on Device and Materials Reliability, Vol. 15, No.1, March, Ed. IEEE, 2015
 
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6 Autres communications

1 Velazco R., Estudio de la robustez frente a SEUs de algoritmos auto-convergentes, Conferencias de Investigación para Posgrado, Facultad de Informatics, Universidad Complutense, Madrid, SPAIN, 2015
 
2 Velazco R., Robustness of intelligent control with respect to radiation induced faults. Estudio de la robustez del "control inteligente" frente a fallos inducidos por las radiaciones, Seminaire in the frame of “Post-graduate Research Conferences”, Conferencias de Investigación para Posgrado, Facultad de Informatics, Universidad Complutense, Madrid, SPAIN, 2015
 
3 Coelho A., Solinas M., Fraire J., Zergainoh N.-E., Ferreyra P., Velazco R., NETFI-2: An Automatic Method for Fault Injection on HDL-Based Designs, Design, Automation & Test in Europe (DATE 2017), Lausanne, SWITZERLAND, DOI: https://www.date-conference.com/system/files/file/date17/ubooth/119922.pdf, 2017
 
4 Velazco R., Efectos de radiaciones en circuitos integrados digitales: orígenes, técnicas de mitigación y test experimentales, Reunión de trabajo en Procesamiento de la Información y Control (RPIC'15), Córdoba, ARGENTINA, 2015
 
5 Ramos P., Vargas V., Baylac M., Zergainoh N.-E., Velazco R., Error-rate prediction of applications implemented in Multi-core and Many-core processors, Radiation Effects on Components Systems (RADECS'2017), Geneva, SWITZERLAND, 2017
 
6 Fraire J., Madoery P., Finochietto J., Charif A., On Route Table Computation Strategies in Delay-Tolerant Satellite Networks, Ad Hoc Networks, Ed. Elsevier, Vol. 80, pp. 31-40, 2018
 
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1 Rapports

1 Papavramidou P., Nicolaidis M., Test Algorithms for ECC-based Memory Repair in Ultimate CMOS and Post-CMOS, ISRN: TIMA-RR--2015/01--FR, 9 avril 2015
 
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4 Thèses

1 Charif A., Design, Parallel Simulation and Implementation of High-Performance Fault-Tolerant Networks-on-Chip Architectures, These de Doctorat, 17 novembre 2017
 
2 Vargas V., Software approach to improve the reliability of parallel applications implemented on multi-core and many-core processors, These de Doctorat, 28 avril 2017
 
3 Ramos P., Evaluation of the SEE sensitivity and methodology for error rate prediction of applications implemented in Multi-core and Many-core processors, These de Doctorat, 18 avril 2017
 
4 Costenaro E., Techniques for the evaluation and the improvement of emergent technologies’ behaviour facing random errors, These de Doctorat, 9 décembre 2015
 
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