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On-chip Pseudorandom Testing for Linear and Nonlinear MEMS

Auteur(s) : A. Dhayni, L. Rufer, S. Mir, A. Bounceur

ISRN: TIMA-RR--06/10-04--FR

In this paper we study the use of pseudorandom test techniques for linear and non linear devices, in particular Micro Electro Mechanical Systems (MEMS). These test techniques lead to practical Built-In-Self techniques. We first present the pseudorandom test technique for linear invariant (LTI) systems. Next, we will illustrate and evaluate the application of these techniques for weakly nonlinear, purely nonlinear and strongly nonlinear devices