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Optimising test sets for RF components with a defect-oriented approach

Auteur(s) : V. Danelon, S. Mir, R. Kheriji, J.L. Carbonero

ISRN: TIMA-RR--05/02-01--FR

This paper is aimed at studying defect-oriented test techniques for RF components in order to optimize production test sets. This study is mandatory for the definition of an efficient test flow strategy. We have carried out a fault simulation campaign for a Low-Noise Amplifier (LNA) for reducing a test set while maintaining high fault coverage. The set of production a test measurements should include low-cost structural tests such as simple current consumption and only a few more sophisticated tests dedicated to functional specifications such as S parameters, Noise Figure (NF) or IP3.