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Comparative Study of On-Line Testing Methods for AMS Systems. Application to Decimation Filters

Auteur(s) : M. A. Naal, S. Mir, E. Simeu

ISRN: TIMA-RR--04/05-02--FR

This paper presents a comparative study of on-line testing techniques implemented for the case of decimation filter. Three different on-line self-test techniques are studied and compared for a 0.6, 0.35 and 0.18 ìm CMOS technologies. The first technique uses a non-concurrent structural testing scheme and the others are both based on semi-concurrent test methodologies. The on-line test circuitry is automatically synthesized and exploits the idle time of the functional units to apply either a structural or a functional test. The decimation filter is used in a ÓÄ Analogue-to-Digital converter that is in turn used in a Built-In-self-Test (BIST) circuitry for mixed signal core testing. Thus, the filter itself must be self-testable