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Improving Reliability of Multi-/Many-Core Processors by Using NMR-MPar Approach

Auteur(s) : V. Vargas, P. Ramos, J-F. Méhaut, R. Velazco

Doc. Source: Radiation Effects on Integrated Circuits and Systems for Space Applications

Publisher : Springer

Pages : 175-203

Doi : 10.1007/978-3-030-04660-6_8