Publications

Publications

< retour aux publications

Guest Editorial: Analog, Mixed-Signal and RF Testing

Auteur(s) : M. Barragan, W. Eisenstadt

Publisher : Springer

Pages : 281-282

Doi : 10.1007/s10836-017-5663-z

The role of nano-electronic systems is rapidly expanding in every facet of modern life. To interact with environment and users, integrated circuits need analog, mixed-signal, RF or MEMS blocks. These blocks could represent a small part of the chip area but have a major impact on IC yield and reliability. Indeed, one of the major bottlenecks nowadays for nano-electronics systems is the post-manufacturing testing of their analog, mixed-signal, RF, and MEMS functions, in order to guarantee outgoing quality while not sacrificing yield......