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Analog and mixed-signal circuits simulation for product level EMMI analysis

Auteur(s) : T. Melis, E. Simeu, E. Auvray, P. Armagnat

Journal : Microelectronics Reliability

Volume : 114

Doi : 10.1016/j.microrel.2020.113881

The goal of this work is to propose a new flow that integrates the analog and mixed signal simulation of the circuits to replicate the EMMI signals. This supports the fault localization process. We explore the emission typologies of the transistors, focusing the attention on the DMOS structure. First experimental results show the benefits of this approach.