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Stuck-At Fault Mitigation of Emerging Technologies Based Switching Lattices

Auteur(s) : L. Anghel, A. Bernasconi, V. Ciriani, L. Frontini, G. Trucco, I. Vatajelu

Journal : Journal of Electronic Testing: Theory and Applications

Pages : 313–326

Doi : 10.1007/s10836-020-05885-2