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The Automated Test Flow, the Present and the Future

Auteur(s) : M. Portolan

Journal : IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Doi : 10.1109/TCAD.2019.2961328

Automation has been responsible for the most important breakthroughs in testing, and it is now a fundamental element of the electronics world. Unfortunately, its progress is now limited by several legacy solutions that are implicitly, and sometimes unknowingly, accepted. The duality Generation/Application of patterns is at the very heart of today’s testing ecosystem, but it is being challenged by the very evolutions it,fostered. The IEEE 1687 standard is symptomatic to this: it proposes hardware and software solutions to boost hierarchical and instrument-based testing, but is full application brings the current Automated Test Flow close to breaking point. It is a typical scaling issue: everything seems fine for small-scale systems in the short term, but problems arises when looking at long-term.
In this paper, we focus on the long-term vision to uncover and explain these limiting elements. We then propose a new flow that overcomes them, unleashes the full potential of new approaches, and fosters evolution.