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Assessment of On-Chip Current Sensor for Detection of Thermal-Neutron Induced Transients

Auteur(s) : R. Possamai Bastos, J.M. Dutertre, M. Garay Trindade, R. Andreoni Camponogara Viera, O. Potin, M. Letiche, B. Cheymol, J. Beaucour

Journal : IEEE Transactions on Nuclear Science

Volume : 67

Issue : 7

Pages : 1404-1411

Doi : 10.1109/tns.2020.2975923

This article assesses, for the first time, a body/bulk built-in current sensor (BBICS) in a CMOS 65-nm test chip under thermal neutron, high-energy neutron, and laser radiation. Experimental results suggest that the on-chip current sensor is effective to detect transient faults in different case-study subcircuits of the chip exposed to the accelerated radiation effects, opening prospects for embedding this type of sensor in reliable, secure, and low-power integrated circuit applications