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Estimation of Analog/RF Parametric Test Metrics Based on a Multivariate Extreme Value Model (Early Access)

Auteur(s) : A. Bounceur, S. Mir, R. Euler, K. Beznia

Journal : IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Doi : 10.1109/TCAD.2019.2907923

Analog/RF built-in test (BIT) techniques are essential for reducing the very high costs of specification-based tests and for high-safety applications. The adoption of a BIT technique needs to be decided at the design stage, and this can be facilitated by estimating the test quality in terms of errors such as Test Escapes (TE) and Yield Loss (YL). Test quality estimation at the design stage has been traditionally very difficult for analog/RF circuits due to the lack of fault models that properly cover parametric faulty behavior. In recent years, statistical simulation has been considered in combination with learning techniques for the estimation of parametric test metrics. Extreme Value Theory (EVT) has provided a rigorous tool for the computation of parametric test metrics. However, test metrics estimation has been limited to the use of a univariate model. In this paper, we extend this approach by using a multivariate extreme value model. We illustrate this for the evaluation of a RF LNA BIT technique using a bivariate model.