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Test and Reliability in Approximate Computing

Auteur(s) : L. Anghel, M. Benabdenbi, A. Bosio, M. Traiola, I. Vatajelu

Journal : Journal of Electronic Testing: Theory and Applications

Volume : 34

Issue : 4

Pages : 375-387

Doi : 10.1007/s10836-018-5734-9

This paper presents an overview of test and reliability approaches for approximate computing architectures. We focus on how specific methods for test and reliability can be used to improve the characteristics of approximate computing in terms of power consumption, area, life expectancy and precision. This paper does not address specification and design of approximate hardware/software/algorithms, but provides an in-depth knowledge on how the reliability and test related techniques can be efficiently used to maximize the benefits of approximate computing.