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Fully-differential 4 V-output range 14.5-ENOB step-wise ramp stimulus generator for on-chip static linearity test of ADCs

Auteur(s) : G. Renaud, M. Diallo, M. Barragan, S. Mir

Journal : IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Doi : 10.1109/TVLSI.2018.2876976