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Assessing Body Built-In Current Sensors for Detection of Multiple Transient Faults

Auteur(s) : R. Andreoni Camponogara Viera, J.M. Dutertre, O. Potin, M.-L. Flottes, G. Di Natale, B. Rouzeyre, R. Possamai Bastos

Journal : Microelectronics Reliability

Volume : 88-90

Pages : 128-134

Doi : 10.1016/j.microrel.2018.07.111

Over the last few years, many architectures of body or bulk built-in current sensors (BBICSs) have been proposed to detect transient faults (TFs) in integrated circuits, all of them assessed through simulations in which only single TFs affect the circuit under run-time test. This work assesses and demonstrates the ability of a BBICS architecture in also detecting multiple and simultaneous TFs. Based on the classical double-exponential transient current model, multiple fault effects on a case-study circuit have been simulated with the injection of several current sources approximately representing the Gaussian distribution of a laser beam attack. Results show the BBICS architecture is able to detect multiple TFs simultaneously perturbing sensitive nodes of the case-study circuit.