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A Procedure for Alternate Test Feature Design and Selection

Auteur(s) : M. Barragan, G. Leger

Journal : IEEE Design and Test of Computers

Volume : 32

Issue : 1

Pages : 18-25

Doi : 10.1109/MDAT.2014.2361722

This paper is a practical illustration of the adoption of alternate tests based upon the judicious selection of the set of parameters to be considered for design as well as to be observed subsequently. The notion of signatures is introduced, and their ability to predict design accuracy is analyzed. The application is demonstrated for an RF LNA circuit.