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Adaptive Alternate Analog Test

Auteur(s) : H. Stratigopoulos, S. Mir

Journal : IEEE Design and Test of Computers

Volume : 29

Issue : 4

Pages : 71-79

Doi : 10.1109/MDT.2012.2205480

We propose an adaptive test flow for analog circuits that relies on an assembly of programmable defect filters. The test flow capitalizes on alternate test to provide a low cost for the majority of fabricated devices. The small fraction of devices for which the alternate test decision may be prone to error are identified by a first defect filter. These devices are forwarded to a second less strict defect filter which examines whether they contain gross defects. In this case, a device is discarded outright as faulty. A device that is screened out by the first filter but passes the second one is considered to be marginal and is tested more exhaustively. The defect filters are built using adaptive kernel density estimation. They are easily programmed using a single parameter which allows to explore the trade-offs of the adaptive test flow. The methodology is demonstrated on a radio frequency (RF) receiver using an alternate Error Vector Magnitude (EVM) test.