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Diagnosis of Local Spot Defects in Analog Circuits

Auteur(s) : K. Huang, H. Stratigopoulos, S. Mir, C. Hora, Y. Xing, B. Kruseman

Journal : IEEE Transactions on Instrumentation and Measurement

Volume : 61

Issue : 10

Pages : 2701 - 2712

Doi : 10.1109/TIM.2012.2196390

We present a method for diagnosing local spot defects in analog circuits. The method aims to identify a subset of defects that are likely to have occurred and suggests to give them priority in a classical failure analysis. For this purpose, the method relies on a combination of multiclass classifiers that are trained using data from fault simulation. The method is demonstrated on an industrial large-scale case study. The device under consideration is a controller area network transceiver used in automobile systems. This device demands high-quality control due to the reliability requirements of the application wherein it is deployed. The diagnosis problem is discussed by taking into consideration the realities of this case study.