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Built-in self-test of linear time invariant systems using maximum-length sequences

Auteur(s) : L. Rufer, E. Simeu, S. Mir

Doc. Source: Poster at IEEE European Test Workshop (ETW'03)

Pages : 111-112

We present a method for a fast and accurate broadband determination of the behaviour of analogue and mixed-signal circuits. This technique is based on impulse response (IR) evaluation using pseudo-random Maximum–Length Sequences (MLS). This approach provides a large dynamic range and is thus an optimal solution for measurements in noisy environments and for low-power test signals.