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IEEE European Test Symposium (ETS)

Auteur(s) : S. Eggersglüß, S. Hamdioui, A. Jutman, M.K. Michael, J. Raik, M. Sonza Reorda, M. Tahoori, I. Vatajelu

Doc. Source: IEEE International Test Conference (ITC'2019)

Publisher : IEEE

Doi : 10.1109/ITC44170.2019.9000148

This paper is dedicated to the IEEE European Test Symposium (ETS). It offers an overview of all the European Test Workshop and Symposium events, from its first edition in 1996 to the next edition in 2020.