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Learning-Based Reliability Assessment Method for Detection of Permanent Faults in Clockless Circuits

Auteur(s) : R. Aquino Guazzelli, M. Garay Trindade, L. Fesquet, R. Possamai Bastos

Doc. Source: 30th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2019)