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BIST Solutions for Industrial Mixed-signal Circuits

Auteur(s) : S. Mir, M. Barragan, M. Mammasse

Doc. Source: 25th International On-Line Testing Symposium (IOLTS 2019)

Publisher : IEEE

This talk will describe BIST solutions that have been developed in the last years in the frame of joint development work between TIMA Laboratory and STMicroelectronics. These solutions that are today of industrial application are aimed at ADCs, PLLs and CMOS imagers. They all use fully or mostly digital test circuitry, making them highly portable across different technologies. We will also draw some perspectives on new joint development work for mixed-signal/RF circuits and systems.