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Assisted test generation strategy for non-intrusive machine learning indirect test of millimeter-wave circuits

Auteur(s) : F. Cilici, M. Barragan, S. Mir, E. Lauga-Larroze, S. Bourdel

Doc. Source: 23rd IEEE European Test Symposium (ETS'2018)

Publisher : IEEE

Pages : 1-6

Doi : 978-1-5386-3728-9/18