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Importance of IR Drops on the Modeling of Laser-Induced Transient Faults

Auteur(s) : R. Andreoni Camponogara Viera, P. Maurine, J.M. Dutertre, R. Possamai Bastos

Doc. Source: International Conference on Synthesis, Modeling, Analysis and simulation methods and applications to Circuit Design (SMACD 2017)

Publisher : IEEE