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Application-aware soft error sensitivity evaluation without fault injections - Application to Leon3

Auteur(s) : K. Chibani, M. Portolan, R. Leveugle

Doc. Source: European Conference on Radiation and its Effects on Components and Systems (RADECS'16)

Publisher : IEEE

Design-time evaluations of the sensitivity of circuits with respect to soft errors are usually done by means of fault injection campaigns. Such campaigns are time-consuming, either in order to prepare the hardware set-up (e.g., prototype on emulation platform) or in terms of simulation run. We propose here an approach avoiding any fault injections but able to evaluate the intrinsic sensitivity of the circuit for a given application by leveraging the work done for functional verification. This approach provides worst-case evaluations with good accuracy and no specific investment. The approach is demonstrated on several applications executed on a Leon3 microprocessor.