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A Novel Test Generation and Application Flow for Functional Access to IEEE 1687 instruments

Auteur(s) : M. Portolan

Doc. Source: IEEE European Test Symposium (ETS'2016)

Publisher : IEEE

Doi : 10.1109/ETS.2016.7519302

The new IEEE 1687 standard provides important novelties, such as dynamic topology and access to deeply embedded instruments. Unfortunately, traditional tool flows are not able to fully address this potential. In this paper we will point out the shortcomings of legacy approaches while proposing a new, backward compatible flow optimized for functional usage of instruments.