Publications

Publications

< retour aux publications

Evaluating Application-Aware Soft Error Effects in Digital Circuits Without Fault Injections or Probabilistic Computations

Auteur(s) : K. Chibani, M. Portolan, R. Leveugle

Doc. Source: 22nd IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS'16)

Publisher : IEEE

Pages : 54-59