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Test and calibration of RF circuits using built-in non-intrusive sensors

Auteur(s) : A. Dimakos, M. Andraud, L. Abdallah, H. Stratigopoulos, E. Simeu, S. Mir

Doc. Source: IEEE International Computer Society Annual Symposium on VLSI (ISVLSI'15)

Publisher : IEEE

Pages : 627

Doi : 10.1109/ISVLSI.2015.42