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Special session: Hot topics: Statistical test methods

Auteur(s) : M. Barragan, G. Leger, F. Azais, R.D. Blanton, Adit D. Singh, S. Sunter

Doc. Source: VLSI Test Symposium (VTS), 2015 IEEE 33rd

Publisher : IEEE

Pages : 1-2

Doi : 10.1109/VTS.2015.7116265

The process of testing Integrated Circuits involves a huge amount of data: electrical circuit measurements, information from wafer process monitors, spatial location of the dies, wafer lot numbers, etc. In addition, the relationships between faults, process variations and circuit performance are likely to be very complex and non-linear. Test (and its extension to diagnosis) should be considered as a challenging highly dimensional multivariate problem.