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Using concurrent and semi-concurrent on-line testing during HLS: an adaptable approach

Auteur(s) : M. A. Naal, M.N. RAKOTOARISOA, E. Simeu, C. Aktouf

Doc. Source: Eighth IEEE International On Line Testing Workshop (IOLTW'02)

Publisher : IEEE

Pages : 184

Doi : 10.1109/OLT.2002.1030208

This paper proposes a suitable on-line testing technique during the synthesis of complex electronic structures. Online testability is addressed by exploiting time redundancy in the scheduled data flow graph. On-line testability constraints are taken into account at the scheduling and allocation tasks. The technique implements non-concurrent; semi-concurrent or fully concurrent on-line tests according to the ability of the synthesized structure.