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Investigation of Electromagnetic Fault Injection Effects on Embedded Cryptosystems

Auteur(s) : D. Alberto, P. Maistri, R. Leveugle

Doc. Source: First Workshop on Trustworthy Manufacturing and Utilization of Secure Devices (TRUDEVICE'13)

Pages : 1-2

This work deals with the electromagnetic pulses (EMP) injection of transient faults into embedded cryptosystems. The purpose of this study is to deepen and better understand the interaction of an electromagnetic (EM) field and a logic device (ASIC). In this direction, a voltage (IR-) drop analysis can be very useful to localize possible circuit weaknesses and identify the most vulnerable regions to EMP attacks. The long term objective is the development of a model able to predict the effects of an EMP on a cryptosystem.