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A predictive bottom-up hierarchical approach to digital system reliability

Auteur(s) : V. Huard, E. Pion, F. Cacho, D. Croain, V. Robert, R. Delater, P. Mergault, S. Engels, L. Anghel, N. Ruiz Amador

Doc. Source: IEEE International Reliability Physics Symposium (IRPS'12)

Publisher : IEEE

Doi : 10.1109/IRPS.2012.6241830

This work has introduced a new electrical aging assessment framework for digital systems, based upon strong physics-based foundations and an adequate bottom-up approach which enables propagating accurate reliability knowledge at system level. This work opens new ways to optimize high level digital systems with respect to aging with great accuracy.