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Interconnect Built-In Self-Repair and Adaptive-Serialization (I-BIRAS) for 3D integrated systems

Auteur(s) : M. Nicolaidis, V. Pasca, L. Anghel

Doc. Source: IEEE International On-Line Testing Symposium (IOLTS’10)

Publisher : IEEE

Pages : 218 - 218

Doi : 10.1109/IOLTS.2010.5560198

The high defect rates of the TSV manufacturing processes lead to poor yield. Interconnect repair and serialization techniques were proposed to improve yield. In these papers the control of the repair and serialization circuitry are determined off-chip and are stored in one-time-programmable memories. In this work we present an Interconnect Built-in Self-Repair and Adaptive-Serialization approach (I-BIRAS), where interconnect repair and data serialization/deserialization is performed without external intervention (reducing cost of external equipment) and can be executed at any time (after fabrication and all along system life), thus coping with both fabrication and system-life defects.