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A SNDR BIST for SigmaDelta Analogue-to-Digital Converters

Auteur(s) : L. Rolindez, S. Mir, A. Bounceur, J.L. Carbonero

Doc. Source: 24th IEEE VLSI Test Symposium (VTS'06)

Publisher : IEEE

Pages : 314-319

Doi : 10.1109/VTS.2006.12

The test of high resolution Sigma-Delta Analogueto- Digital Converters (SigmaDelta ADCs) is a costly task due to its high resolution and the large number of samples required. In this paper, we propose a Built-In Self-Test (BIST) technique for the test of SNDR (Signal-to-Noise plus Distortion Ratio) in SigmaDelta ADCs. The technique, mostly digital, uses a binary stream as test stimulus and carries out a sine-wave fitting algorithm to analyse the output response. Both the test signal generation and the output response analysis are performed on-chip, taking advantage of the digital resources already present in a SigmaDelta ADC. Simulations results show the capability of this technique to obtain measures of the SNDR for a 16-bit audio SigmaDelta ADC.