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Toward automated fault pruning with Petri nets

Auteur(s) : P. Maistri, R. Leveugle

Doc. Source: International on-line Testing Symposium (IOLTS’09)

Publisher : IEEE

Pages : 41-46

Doi : 10.1109/IOLTS.2009.5195981

Embedded systems design is starting considering dependability issues even for mass-market systems. Soft error consequences must in particular be carefully analyzed. Usually, fault injection campaigns are run to analyze the consequences of transient faults, but the length of a comprehensive evaluation often collides with the severe requirements on design cycle times. We propose a new fault pruning technique to identify harmless components and computation cycles as soon as possible, thus avoiding useless fault injection experiments. The technique is based on a formal model of the system and we show that it can be used for both SEUs and SETs.