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Defect filter for alternate RF test

Auteur(s) : H. Stratigopoulos, S. Mir, E. Acar, S. Ozev

Doc. Source: IEEE European Test Symposium (ETS’09)

Publisher : IEEE

Pages : 101-106

Doi : 10.1109/ETS.2009.32

Alternate RF testing is a very promising candidate for replacing the costly standard specification-based approach. The defect filter in the alternate test flow is a crucial preparatory step for the overall success of alternate test. In this paper, we present a novel nonlinear defect filter based on an estimate of the joint probability density function of the alternate measurements. The construction of the filter does not require a defect dictionary and can accommodate any underlying density without needing any prior knowledge regarding its parametric form.