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Software-based BIST capabilities of the Advanced Encryption Standard

Auteur(s) : C. Excoffon, P. Maistri, R. Leveugle

Doc. Source: Electronic Symposium Digest of 13th IEEE European Test Symposium (ETS'08)

Publisher : IEEE

Cryptographic devices have to be fully testable in order to ensure proper functionalities. The possibility of using the ciphering circuit itself to perform self testing has been proposed. In this paper, we further explore this approach and we analyze the configuration parameters that affect the fault coverage. We show that achieving 100% coverage is less easy than previously published.