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Optimising test sets for RF components with a defect-oriented approach

Auteur(s) : R. Kheriji, V. Danelon, J.L. Carbonero, S. Mir

Doc. Source: 16th International Conference on Microelectronics (ICM'04)

Publisher : IEEE

Pages : 400-403

Doi : 10.1109/ICM.2004.1434597

This paper is aimed at studying defect-oriented test techniques for RF components in order to optimize production test sets. This study is mandatory for the definition of an efficient test flow strategy. We have carried out a fault simulation campaign for a low-noise amplifier (LNA) for reducing a test set while maintaining high fault coverage. The set of production test measurements should include low-cost structural tests such as simple current consumption and only a few more sophisticated tests dedicated to functional specifications such as S parameters, noise figure (NF) or IP3.