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Defect and fault modelling of CMOS active pixel sensors

Auteur(s) : L. Lizarraga, S. Mir, G. Sicard, A. Dragulinescu

Doc. Source: IEEE Latin American Test Workshop (LATW’07)

Publisher : IEEE

This paper studies the defects and failure mechanisms that can occur in CMOS imager pixels. Catastrophic and parametric fault models are then considered for modelling the faulty behaviour of pixel transistors and the photodiode. Failure mechanisms specific to the photodiodes are considered. These fault models are considered for two casestudy pixels, and we study for each case catastrophic and parametric faults.