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CAT platform for analogue and mixed-signal test evaluation and optimization

Auteur(s) : A. Bounceur, S. Mir, E. Simeu, L. Rolindez

Doc. Source: 14th IFIP International Conference on Very Larage Scale Integration (VLSI-SoC’06)

Publisher : IFIP

Pages : 320-325

This paper introduces a Computer-Aided-Test platform that has been developed for the evaluation of test techniques for analogue and mixed-signal circuits. The CAT platform, integrated in the Cadence Design Framework Environment, includes tools for fault simulation, test generation and test optimization for these types of circuits. Fault modeling and fault injection are simulator independent, which makes this approach flexible with respect to past approaches. In this paper, the use of this platform is illustrated for test optimization for the case of a fully differential amplifier. Test limits are set using a stastitical circuit performance analysis that acounts for process deviations. Test metrics are estimated using this analysis. Specification-based tests are next optimized in terms of their capability of detecting catastrophic faults.