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Optimising Test Sets for a Low Noise Amplifier with a Defect-Oriented Approach

Auteur(s) : R. Kheriji, V. Danelon, J.L. Carbonero, S. Mir

Doc. Source: IEEE Design, Automation and Test in Europe Conference (DATE'05)

Publisher : IEEE

Pages : 170-171

Doi : 10.1109/DATE.2005.233

This paper is aimed at studying defect-oriented test techniques for RF components in order to optimize production test sets. This study is mandatory for the definition of an efficient test flow strategy. We have carried out a fault simulation campaign for a Low-Noise Amplifier (LNA) for reducing a test set while maintaining high fault coverage. The set of production test measurements should include low-cost structural tests such as simple current consumption and only a few more sophisticated tests dedicated to functional specifications such as S parameters, Noise Figure (NF) or IP3.