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A low-cost digital frequency testing approach for mixed-signal devices using sigma-delta modulation

Auteur(s) : G. Prenat, S. Mir, D. Vasquez, L. Rolindez

Doc. Source: 10th International Mixed-Signal Testing Workshop (IMSTW'04)

Publisher : IEEE

This paper presents a digital approach to frequency testing of Analogue and Mixed-Signal (AMS) circuits. This approach is aimed at facilitating low-cost test techniques for System-on-Chip (SoC) devices, rendering the test of mixed-signal cores compatible with the use of a low-cost digital tester. Analogue test signal generation is performed on-chip by low pass filtering a Sigma-Delta (¥Ò.) encoded bit-stream. Analogue harmonic test response analysis is also performed on-chip using square wave modulation and ¥Ò. modulation. Since both analogue signal generation and test response analysis are digitally programmable on-chip, compatibility with a low-cost digital tester is ensured. Optimisation of test signatures is discussed in detail as a trade-off between test time and test quality.