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Séminaires


RICHARDSON A. (Dr.), Lancaster U.

Theme: Defect Oriented Testability Analysis and Analog DFT
Date: 06/94

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Dr. Y. A. ZORIAN, AT&T Bell Labs, NJ

Theme: Multi-Chip Module Testing
Date: 03/94

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O'LEARY J. (Mr.), Cornell U., Ithaca, NY

Theme: Retargeting a Hardware Compiler Proof
Date: 11/93

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AAS E. (Prof.), The Norwegian Inst. of Technology

Theme: Probabilistic Model of Design Quality
Date: 07/93

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ABRAHAM J. A. (Prof.), U. Texas, Austin

Theme: Testing of Analog Circuits
Date: 06/93

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IVANOV A. (Prof.), U. British Columbia, Vancouver

Theme: BIST Compaction Schemes based on Multiple Signature Checking
Date: 06/93

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SOMA M. (Prof.), U. Washington, Seattle

Theme: Mixed-Signal Testing and DFT
Date: 04/93

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KURDAHI F. J. (Prof. ), U. California, Irvine

Theme: Architectural Synthesis of DSP Systems
Date: 03/93

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KINNIMENT D. (Prof. ), U. Newcastle Upon Tyne

Theme: Correct Interactive Transformational Synthesis of DSP Hardware
Date: 11/92

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