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Prof. William R. EISENSTADT, University of Florida - Dept. of Electrical and Computer Eng - Gainesville - FL

Theme: Practical Design for Test and BIST for RF and Mixed-Signal Circuits
Date: March 6th, 2020 - 14:00 to 15:30, TIMA Laboratory - Room T312


William (Bill) R. EISENSTADT (SM’92) received the B.S., M.S., and Ph.D. degrees in Electrical Engineering from Stanford University, Stanford, CA, in 1979, 1981, and 1986. Subsequently, he joined the faculty of the University of Florida, Gainesville, FL, where he is now a Professor. His research focuses on mixed-signal/RF embedded IC testing, high-speed I/O characterization, BIST, and differential s-parameter characterization of ICs, packages, and interconnect. He has over 35 years experience in IC design and test and has over 180 refereed conference and journal publications, 16 patents and has advised 24 PhD graduates. His book “Microwave Circuit Design Using Mixed-Mode S-parameters,” by William R. EISENSTADT, Bob STENGEL and Bruce THOMPSON, Artech House, Spring 2006.


Prof. Bill EISENSTADT has microwave/millimeter wave test research at the University of Florida. Prior work focused on building and verifying on-chip test sub-circuits between 1 GHz and 100 GHz and in demonstrating novel GHz circuit concepts in the embedded RF/microwave test area. Example microwave ICs have been realized that measure gain and phase, sample signals, measure power, GHz measurements of S-parameters, phase noise as well as automated microwave matching for wideband antennas. Currently, Prof. EISENSTADT is working on developing on-chip IC test enhancement techniques for production test to reduce the field failures.